Unprecedented Catalysis of Cs+ Single Sites Confined in Y Zeolite Pores for Selective Csp3–H Bond Ammoxidation: Transformation of Inactive Cs+ Ions with a Noble Gas Electronic Structure to Active Cs+ Single Sites

ACS Catalysis ◽  
2021 ◽  
pp. 6698-6708
Author(s):  
Shankha S. Acharyya ◽  
Shilpi Ghosh ◽  
Yusuke Yoshida ◽  
Takuma Kaneko ◽  
Takehiko Sasaki ◽  
...  
2010 ◽  
Vol 16 (43) ◽  
pp. 12804-12807 ◽  
Author(s):  
Ivan Infante ◽  
Lester Andrews ◽  
Xeufeng Wang ◽  
Laura Gagliardi

Author(s):  
Raquel Yanes-Rodríguez ◽  
Rita Prosmiti

We have assessed the performance and accuracy of different wavefunction-based electronic structure methods, such as DFMP2 and domain-based local pair-natural orbital (DLPNO-CCSD(T)), as well as a variety of density functional...


2009 ◽  
Vol 14 (S12) ◽  
pp. 257-269
Author(s):  
H. H. Michels ◽  
R. H. Hobbs ◽  
L. A. Wright

2020 ◽  
Vol 11 (26) ◽  
pp. 6642-6652 ◽  
Author(s):  
Said Jalife ◽  
Jessica Arcudia ◽  
Sudip Pan ◽  
Gabriel Merino

This review focuses on the available experimental and theoretical investigations on noble gas (Ng) endohedral fullerenes, addressing the effects of confinement of one or more Ng atoms into the electronic structure and reactivity of fullerenes.


Author(s):  
S.J. Splinter ◽  
J. Bruley ◽  
P.E. Batson ◽  
D.A. Smith ◽  
R. Rosenberg

It has long been known that the addition of Cu to Al interconnects improves the resistance to electromigration failure. It is generally accepted that this improvement is the result of Cu segregation to Al grain boundaries. The exact mechanism by which segregated Cu increases service lifetime is not understood, although it has been suggested that the formation of thin layers of θ-CuA12 (or some metastable substoichiometric precursor, θ’ or θ”) at the boundaries may be necessary. This paper reports measurements of the local electronic structure of Cu atoms segregated to Al grain boundaries using spatially resolved EELS in a UHV STEM. It is shown that segregated Cu exists in a chemical environment similar to that of Cu atoms in bulk θ-phase precipitates.Films of 100 nm thickness and nominal composition Al-2.5wt%Cu were deposited by sputtering from alloy targets onto NaCl substrates. The samples were solution heat treated at 748K for 30 min and aged at 523K for 4 h to promote equilibrium grain boundary segregation. EELS measurements were made using a Gatan 666 PEELS spectrometer interfaced to a VG HB501 STEM operating at 100 keV. The probe size was estimated to be 1 nm FWHM. Grain boundaries with the narrowest projected width were chosen for analysis. EDX measurements of Cu segregation were made using a VG HB603 STEM.


Sign in / Sign up

Export Citation Format

Share Document