Injection Molding of Superhydrophobic Submicrometer Surface Topography on Macroscopically Curved Objects: Experimental and Simulation Studies

2019 ◽  
Vol 1 (6) ◽  
pp. 1547-1558 ◽  
Author(s):  
Wei Li Lee ◽  
Dong Wang ◽  
Jumiati Wu ◽  
Qi Ge ◽  
Hong Yee Low
Keyword(s):  
Injection Molding ◽  
Surface Topography ◽  
Simulation Studies ◽  
Curved Objects

Gloss and surface topography of ABS: A study on the influence of the injection molding parameters

2006 ◽  
Vol 46 (10) ◽  
pp. 1394-1401 ◽  
Author(s):  
M. J. Oliveira ◽  
A. M. Brito ◽  
M. C. Costa ◽  
M. F. Costa
Keyword(s):  
Injection Molding ◽  
Surface Topography

Impact of deep cores surface topography generated by micro milling on the demolding force in micro injection molding

2017 ◽  
Vol 246 ◽  
pp. 211-223 ◽  
Author(s):  
Davide Masato ◽  
Marco Sorgato ◽  
Paolo Parenti ◽  
Massimiliano Annoni ◽  
Giovanni Lucchetta
Keyword(s):  
Injection Molding ◽  
Surface Topography ◽  
Micro Milling ◽  
Micro Injection Molding

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Effects of Ion Beam Milling on Surface Topography

1973 ◽  
Vol 31 ◽  
pp. 84-85
Author(s):  
P.G. Pawar ◽  
P. Duhamel ◽  
G.W. Monk
Keyword(s):  
Surface Topography ◽  
Ion Beam ◽  
Solid Material ◽  
Beam Current ◽  
Atomic Mass ◽  
Micro Milling ◽  
Ion Milling ◽  
Controlled Atmospheres ◽  
Milling Operations ◽  
Sufficient Energy

A beam of ions of mass greater than a few atomic mass units and with sufficient energy can remove atoms from the surface of a solid material at a useful rate. A system used to achieve this purpose under controlled atmospheres is called an ion miliing machine. An ion milling apparatus presently available as IMMI-III with a IMMIAC was used in this investigation. Unless otherwise stated, all the micro milling operations were done with Ar+ at 6kv using a beam current of 100 μA for each of the two guns, with a specimen tilt of 15° from the horizontal plane.It is fairly well established that ion bombardment of the surface of homogeneous materials can produce surface topography which resembles geological erosional features.

Low-Loss Images in a Stem/Tem Microscope

1976 ◽  
Vol 34 ◽  
pp. 496-497 ◽  
Author(s):  
David C. Joy ◽  
Dennis M. Maher
Keyword(s):  
High Resolution ◽  
Surface Topography ◽  
Beam Direction ◽  
Low Loss ◽  
Specimen Holder ◽  
Glancing Angle ◽  
High Resolution Images ◽  
Set Up ◽  
Conventional Manner ◽  
Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

A procedure for cross-sectioning materials for TEM analysis without ion milling

1990 ◽  
Vol 48 (4) ◽  
pp. 742-743
Author(s):  
J.P. Benedict ◽  
Ron Anderson ◽  
S. J. Klepeis
Keyword(s):  
Surface Topography ◽  
Milling Time ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Cleaning Operation ◽  
Tem Analysis ◽  
Platinum Silicide ◽  
Surface Alteration ◽  
Polishing Damage ◽  
Tools And Methods

Traditional specimen preparation procedures for non-biological samples, especially cross section preparation procedures, involves subjecting the specimen to ion milling for times ranging from minutes to tens of hours. Long ion milling time produces surface alteration, atomic number and rough-surface topography artifacts, and high temperatures. The introduction of new tools and methods in this laboratory improved our ability to mechanically thin specimens to a point where ion milling time was reduced to one to ten minutes. Very short ion milling times meant that ion milling was more of a cleaning operation than a thinning operation. The preferential thinning and the surface topography that still existed in briefly ion milled samples made the study of interfaces between materials such as platinum silicide and silicon difficult. These two problems can be eliminated by completely eliminating the ion milling step and mechanically polishing the sample to TEM transparency with the procedure outlined in this communication. Previous successful efforts leading to mechanically thinned specimens have shown that problems center on tool tilt control, removal of polishing damage, and specimen cleanliness.

High Resolution Low Loss Microscopy of Crystalline Surfaces

1980 ◽  
Vol 38 ◽  
pp. 162-163
Author(s):  
William Krakow ◽  
Alec N. Broers
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Surface Topography ◽  
Secondary Electron ◽  
Objective Lens ◽  
Surface Imaging ◽  
Low Loss ◽  
Fine Grained ◽  
Scanning Electron ◽  
Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

How nanoscale surface steps promote ice growth on feldspar: microscopy observation of morphology-enhanced condensation and freezing

Nanoscale ◽  
2019 ◽  
Vol 11 (44) ◽  
pp. 21147-21154 ◽  
Author(s):  
Raymond W. Friddle ◽  
Konrad Thürmer
Keyword(s):  
Surface Topography ◽  
Video Microscopy ◽  
Microscopy Observation ◽  
Atmospheric Dust ◽  
Ice Growth ◽  
Surface Steps

Video microscopy and AFM are used to relate surface topography to a mineral's ability to promote ice growth. On feldspar, abundant as atmospheric dust, basic surface steps can facilitate condensation and freezing when air becomes saturated.

Benefits from Computerized Adaptive Testing as Seen in Simulation Studies

1999 ◽  
Vol 15 (2) ◽  
pp. 91-98 ◽  
Author(s):  
Lutz F. Hornke
Keyword(s):  
Measurement Error ◽  
Computerized Adaptive Testing ◽  
Test Procedure ◽  
Adaptive Testing ◽  
Parameter Estimates ◽  
Simulation Studies ◽  
Computerized Adaptive Test ◽  
Item Banks ◽  
Item Parameters ◽  
General Reliability

Summary: Item parameters for several hundreds of items were estimated based on empirical data from several thousands of subjects. The logistic one-parameter (1PL) and two-parameter (2PL) model estimates were evaluated. However, model fit showed that only a subset of items complied sufficiently, so that the remaining ones were assembled in well-fitting item banks. In several simulation studies 5000 simulated responses were generated in accordance with a computerized adaptive test procedure along with person parameters. A general reliability of .80 or a standard error of measurement of .44 was used as a stopping rule to end CAT testing. We also recorded how often each item was used by all simulees. Person-parameter estimates based on CAT correlated higher than .90 with true values simulated. For all 1PL fitting item banks most simulees used more than 20 items but less than 30 items to reach the pre-set level of measurement error. However, testing based on item banks that complied to the 2PL revealed that, on average, only 10 items were sufficient to end testing at the same measurement error level. Both clearly demonstrate the precision and economy of computerized adaptive testing. Empirical evaluations from everyday uses will show whether these trends will hold up in practice. If so, CAT will become possible and reasonable with some 150 well-calibrated 2PL items.

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