Photogenerated Charge-Aided Low-Voltage Operation of n-Channel Organic Transistors with n-Type Conjugated Polymers─Toward Photosensor Applications

2021 ◽  
Author(s):  
Saebom Lee ◽  
Taehoon Kim ◽  
Hwajeong Kim ◽  
Youngkyoo Kim
Keyword(s):  
Conjugated Polymers ◽  
Low Voltage ◽  
Organic Transistors ◽  
Low Voltage Operation

High-current and low-voltage operation of metal-base organic transistors with LiF∕Al emitter

2006 ◽  
Vol 88 (15) ◽  
pp. 153512 ◽  
Author(s):  
Ken-ichi Nakayama ◽  
Shin-ya Fujimoto ◽  
Masaaki Yokoyama
Keyword(s):  
Low Voltage ◽  
Organic Transistors ◽  
High Current ◽  
Metal Base ◽  
Low Voltage Operation

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

High resolution at low voltage: A new approach

1989 ◽  
Vol 47 ◽  
pp. 76-77
Author(s):  
Arthur V. Jones
Keyword(s):  
Low Voltage ◽  
Emission Sources ◽  
New Approach ◽  
Design Concepts ◽  
Probe Diameter ◽  
Low Voltage Operation ◽  
Sufficient Intensity ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Immersion Type

With the introduction of field-emission sources and “immersion-type” objective lenses, the resolution obtainable with modern scanning electron microscopes is approaching that obtainable in STEM and TEM-but only with specific types of specimens. Bulk specimens still suffer from the restrictions imposed by internal scattering and the need to be conducting. Advances in coating techniques have largely overcome these problems but for a sizeable body of specimens, the restrictions imposed by coating are unacceptable.For such specimens, low voltage operation, with its low beam penetration and freedom from charging artifacts, is the method of choice.Unfortunately the technical dificulties in producing an electron beam sufficiently small and of sufficient intensity are considerably greater at low beam energies — so much so that a radical reevaluation of convential design concepts is needed.The probe diameter is usually given by

Solution Shearing of a High‐Capacitance Polymer Dielectric for Low‐Voltage Organic Transistors

2019 ◽  
Vol 5 (6) ◽  
pp. 1900067 ◽  
Author(s):  
Katherina Haase ◽  
Jakob Zessin ◽  
Konstantinos Zoumboulis ◽  
Markus Müller ◽  
Mike Hambsch ◽  
...  
Keyword(s):  
Low Voltage ◽  
Organic Transistors ◽  
High Capacitance ◽  
Polymer Dielectric

Low-voltage operation of the organic thin film transistor with a diagonal configuration

2003 ◽  
Author(s):  
Toshihide Kamata ◽  
Manabu Yoshida ◽  
Sei Uemura ◽  
Satoshi Hoshino ◽  
Noriyuki Takada ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Voltage ◽  
Thin Film Transistor ◽  
Organic Thin Film ◽  
Organic Thin Film Transistor ◽  
Low Voltage Operation

A C-Switch cell for low-voltage operation and high-density SRAMs

2002 ◽  
Author(s):  
H. Kuriyama ◽  
Y. Ishigaki ◽  
Y. Fujii ◽  
S. Maegawa ◽  
S. Maeda ◽  
...  
Keyword(s):  
Low Voltage ◽  
High Density ◽  
Low Voltage Operation
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