Tribo-Induced Interfacial Material Transfer of an Atomic Force Microscopy Probe Assisting Superlubricity in a WS2/Graphene Heterojunction

2019 ◽  
Vol 12 (3) ◽  
pp. 4031-4040 ◽  
Author(s):  
Jisen Tian ◽  
Xuan Yin ◽  
Jinjin Li ◽  
Wei Qi ◽  
Peng Huang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Material Transfer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Interfacial Material

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

2006 ◽  
Vol 100 (7) ◽  
pp. 074315 ◽  
Author(s):  
Osamu Takeuchi ◽  
Takaaki Miyakoshi ◽  
Atsushi Taninaka ◽  
Katsunori Tanaka ◽  
Daichi Cho ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Control ◽  
Force Spectroscopy ◽  
Dynamic Force ◽  
Atomic Force Microscopy Probe ◽  
Dynamic Force Spectroscopy ◽  
Force Microscopy ◽  
Spectroscopy Measurement ◽  
Atomic Force

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

2018 ◽  
Vol 24 (2) ◽  
pp. 126-131 ◽  
Author(s):  
Sergey Y. Luchkin ◽  
Keith J. Stevenson
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Experimental Results ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Potential Sensitivity

AbstractIn this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

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