Decoupling Mesoscale Functional Response in PLZT across the Ferroelectric–Relaxor Phase Transition with Contact Kelvin Probe Force Microscopy and Machine Learning

Sabine M. Neumayer; Liam Collins; Rama Vasudevan; Christopher Smith; Suhas Somnath; Vladimir Ya. Shur; Stephen Jesse; Andrei L. Kholkin; Sergei V. Kalinin; Brian J. Rodriguez

doi:10.1021/acsami.8b15872

Decoupling Mesoscale Functional Response in PLZT across the Ferroelectric–Relaxor Phase Transition with Contact Kelvin Probe Force Microscopy and Machine Learning

ACS Applied Materials & Interfaces ◽

10.1021/acsami.8b15872 ◽

2018 ◽

Vol 10 (49) ◽

pp. 42674-42680 ◽

Cited By ~ 4

Author(s):

Sabine M. Neumayer ◽

Liam Collins ◽

Rama Vasudevan ◽

Christopher Smith ◽

Suhas Somnath ◽

...

Keyword(s):

Machine Learning ◽

Phase Transition ◽

Functional Response ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Ferroelectric Relaxor ◽

Force Microscopy

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Sub-10 nm Probing of Ferroelectricity in Heterogeneous Materials by Machine Learning Enabled Contact Kelvin Probe Force Microscopy

ACS Applied Electronic Materials ◽

10.1021/acsaelm.1c00569 ◽

2021 ◽

Author(s):

Sebastian W. Schmitt ◽

Rama K. Vasudevan ◽

Maurice Seifert ◽

Albina Y. Borisevich ◽

Veeresh Deshpande ◽

...

Keyword(s):

Machine Learning ◽

Heterogeneous Materials ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

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Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/27/20/205703 ◽

2016 ◽

Vol 27 (20) ◽

pp. 205703 ◽

Cited By ~ 3

Author(s):

F Emmerich ◽

C Thielemann

Keyword(s):

Potential Distribution ◽

Real Space ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Space Measurement

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Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/14/145705 ◽

2008 ◽

Vol 19 (14) ◽

pp. 145705 ◽

Cited By ~ 26

Author(s):

Th Glatzel ◽

M Rusu ◽

S Sadewasser ◽

M Ch Lux-Steiner

Keyword(s):

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

Microelectronic Engineering ◽

10.1016/j.mee.2016.02.046 ◽

2016 ◽

Vol 157 ◽

pp. 71-77 ◽

Cited By ~ 1

Author(s):

Krzysztof Gajewski ◽

Witold Szymański ◽

Piotr Niedzielski ◽

Teodor Gotszalk

Keyword(s):

High Strength ◽

Kelvin Probe Force Microscopy ◽

Low Density Polyethylene ◽

Low Density ◽

Kelvin Probe ◽

Force Microscopy

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Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽

10.1039/c7nr05250b ◽

2018 ◽

Vol 10 (2) ◽

pp. 538-547 ◽

Cited By ~ 4

Author(s):

Hyungbeen Lee ◽

Sang Won Lee ◽

Gyudo Lee ◽

Wonseok Lee ◽

Kihwan Nam ◽

...

Keyword(s):

Kelvin Probe Force Microscopy ◽

Powerful Method ◽

Kelvin Probe ◽

Single Nucleotide ◽

Force Microscopy ◽

Surface Potentials ◽

Dna Mismatches ◽

Nucleotide Resolution ◽

Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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Kelvin Probe Force Microscopy in Surface Chemistry: Reactivity of Pd Nanoparticles on Highly Oriented Pirolytic Graphite

ACS Catalysis ◽

10.1021/cs500177h ◽

2014 ◽

Vol 4 (6) ◽

pp. 1838-1844 ◽

Cited By ~ 16

Author(s):

Elisa Palacios-Lidón ◽

Claude R. Henry ◽

Clemens Barth

Keyword(s):

Surface Chemistry ◽

Pd Nanoparticles ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Thin films of amphiphilic polyelectrolytes. Soft materials characterized by Kelvin probe force microscopy

Polymer ◽

10.1016/j.polymer.2013.07.066 ◽

2013 ◽

Vol 54 (21) ◽

pp. 5733-5740 ◽

Cited By ~ 3

Author(s):

X.G. Briones ◽

M.D. Urzúa ◽

H.E. Ríos ◽

F.J. Espinoza-Beltrán ◽

R. Dabirian ◽

...

Keyword(s):

Thin Films ◽

Soft Materials ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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