Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction
2017 ◽
Vol 9
(15)
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pp. 13726-13732
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1973 ◽
Vol 31
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pp. 132-133
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1974 ◽
Vol 32
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pp. 506-507
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