scholarly journals Segregation Engineering in MgO Nanoparticle-Derived Ceramics: The Impact of Calcium and Barium Admixtures on the Microstructure and Light Emission Properties

2021 ◽  
Author(s):  
Thomas Schwab ◽  
Korbinian Aicher ◽  
Hasan Razouq ◽  
Gregor A. Zickler ◽  
Oliver Diwald
Keyword(s):  
Light Emission ◽  
Emission Properties ◽  
The Impact ◽  
Mgo Nanoparticle

VLSI Design for Functional Failure Analysis in the < 90 nm and Flip-Chip Era

2003 ◽  
Author(s):  
Yoav Weizman ◽  
Ezra Baruch
Keyword(s):  
Failure Analysis ◽  
Flip Chip ◽  
Light Emission ◽  
Vlsi Design ◽  
Optical Resolution ◽  
Critical Issue ◽  
Acquisition Time ◽  
Resolution Limit ◽  
Design Rules ◽  
The Impact

Abstract In recent years, two new techniques were introduced for flip chip debug; the Laser Voltage Probing (LVP) technique and Time Resolved Light Emission Microscopy (TRLEM). Both techniques utilize the silicon’s relative transparency to wavelengths longer than the band gap. This inherent wavelength limitation, together with the shrinking dimensions of modern CMOS devices, limit the capabilities of these tools. It is known that the optical resolution limits of the LVP and TRLEM techniques are bounded by the diffraction limit which is ~1um for both tools using standard optics. This limitation was reduced with the addition of immersion lens optics. Nevertheless, even with this improvement, shrinking transistor geometry is leading to increased acquisition time, and the overlapping effect between adjacent nodes remains a critical issue. The resolution limit is an order of magnitude above the device feature densities in the &lt; 90nm era. The scaling down of transistor geometry is leading to the inevitable consequence where more than 50% of the transistors in 90nm process have widths smaller than 0.4um. The acquisition time of such nodes becomes unreasonably long. In order to examine nodes in a dense logic cuicuit, cross talk and convolution effects between neighboring signals also need to be considered. In this paper we will demonstrate the impact that these effects may have on modern design. In order to maintain the debug capability, with the currently available analytical tools for future technologies, conceptual modification of the FA process is required. This process should start on the IC design board where the VLSI designer should be familiar with FA constraints, and thus apply features that will enable enhanced FA capabilities to the circuit in hand during the electrical design or during the physical design stages. The necessity for reliable failure analysis in real-time should dictate that the designer of advanced VLSI blocks incorporates failure analysis constraints among other design rules. The purpose of this research is to supply the scientific basis for the optimal incorporation of design rules for optical probing in the &lt; 90nm gate era. Circuit designers are usually familiar with the nodes in the design which are critical for debug, and the type of measurement (logic or DC level) they require. The designer should enable the measurement of these signals by applying certain circuit and physical constraints. The implementation of these constraints may be done at the cell level, the block level or during the integration. We will discuss the solutions, which should be considered in order to mitigate tool limitations, and also to enable their use for next generation processes.

scholarly journals RESEARCH OF ELECTRON RESONANT TUNNELING AND LIGHT EMISSION PROPERTIES OF DOUBLE-BARRIER TUNNER JUNCTION

1999 ◽  
Vol 48 (2) ◽  
pp. 326
Author(s):  
WANG MAO-XIANG ◽  
SUN CHENG-XIU ◽  
SHI XIAO-CHUN ◽  
YU JIAN-HUA
Keyword(s):  
Resonant Tunneling ◽  
Light Emission ◽  
Double Barrier ◽  
Emission Properties

Insights on the impact of photophysical processes and defect states evolution on the emission properties of surface-modified ZnO nanoplates for application in photocatalysis and hybrid LEDs

2021 ◽  
Author(s):  
Dhritiman Banerjee ◽  
Payal Banerjee ◽  
Asit Kumar Kar
Keyword(s):  
Zinc Oxide ◽  
Optical Properties ◽  
Surface Modification ◽  
Defect State ◽  
Defect States ◽  
Emission Properties ◽  
Photophysical Processes ◽  
State Densities ◽  
Surface Modified ◽  
The Impact

The effects of surface modification on the defect state densities, optical properties, photocatalytic and quantum efficiencies of zinc oxide (ZnO) nanoplates have been studied in this work. Here, the aim...

2D perovskite hybrid with both semiconductive and yellow light emission properties

2019 ◽  
Vol 102 ◽  
pp. 90-94 ◽  
Author(s):  
Ling-Yun Rong ◽  
Chao Hu ◽  
Zhong-Ning Xu ◽  
Guan-E Wang ◽  
Guo-Cong Guo
Keyword(s):  
Light Emission ◽  
Yellow Light ◽  
Emission Properties

Deep-ultraviolet light emission properties of nonpolar M-plane AlGaN quantum wells

2014 ◽  
Vol 105 (5) ◽  
pp. 053104 ◽  
Author(s):  
Ryan G. Banal ◽  
Yoshitaka Taniyasu ◽  
Hideki Yamamoto
Keyword(s):  
Quantum Wells ◽  
Ultraviolet Light ◽  
Light Emission ◽  
Emission Properties ◽  
Deep Ultraviolet

In-depth and in-plane profiling of light emission properties of InGaN-based laser diode

2004 ◽  
Vol 201 (2) ◽  
pp. 207-211
Author(s):  
M. Godlewski ◽  
E. M. Goldys ◽  
M. R. Phillips ◽  
T. B�ttcher ◽  
S. Figge ◽  
...  
Keyword(s):  
Laser Diode ◽  
Light Emission ◽  
Emission Properties
Sign in / Sign up

Export Citation Format

Share Document