Enhanced Interfacial Integrity of Amorphous Oxide Thin-Film Transistors by Elemental Diffusion of Ternary Oxide Semiconductors

2020 ◽  
Vol 12 (52) ◽  
pp. 57996-58004
Author(s):  
Seong-Pil Jeon ◽  
Jae Sang Heo ◽  
Insoo Kim ◽  
Yong-Hoon Kim ◽  
Sung Kyu Park
2006 ◽  
Vol 45 (5B) ◽  
pp. 4303-4308 ◽  
Author(s):  
Kenji Nomura ◽  
Akihiro Takagi ◽  
Toshio Kamiya ◽  
Hiromichi Ohta ◽  
Masahiro Hirano ◽  
...  

2020 ◽  
Vol 8 (43) ◽  
pp. 14983-14995 ◽  
Author(s):  
Dongil Ho ◽  
Hyewon Jeong ◽  
Sunwoo Choi ◽  
Choongik Kim

This highlight reviews the recent studies on organic passivation for the stability enhancement of oxide thin-film transistors.


Sign in / Sign up

Export Citation Format

Share Document