Back-Channel Defect Termination by Sulfur for p-Channel Cu2O Thin-Film Transistors
2015 ◽
Vol 33
(5)
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pp. 051211
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2016 ◽
Vol 16
(12)
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pp. 12878-12881
2012 ◽
Vol 30
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pp. 060605
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2017 ◽
Vol 38
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pp. 1394-1397
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2020 ◽
Vol 91
(3)
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pp. 30201
2010 ◽
Vol 130
(2)
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pp. 161-166
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