Revealing the Phase-Transition Dynamics and Mechanism in a Spinel Li4Ti5O12 Anode Material through in Situ Electron Microscopy

2020 ◽  
Vol 12 (18) ◽  
pp. 20874-20881 ◽  
Author(s):  
Longfei Wang ◽  
Zhi Zhang ◽  
Yongfa Cheng ◽  
Yanan Zhang ◽  
Weifeng Liu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Phase Transition ◽  
Anode Material ◽  
Transition Dynamics ◽  
In Situ Electron Microscopy ◽  
Li4ti5o12 Anode

scholarly journals Fabrication of a liquid cell for in situ transmission electron microscopy

Microscopy ◽  
2020 ◽  
Author(s):  
Xiaoguang Li ◽  
Kazutaka Mitsuishi ◽  
Masaki Takeguchi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cost Effective ◽  
Production Method ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Liquid Cell ◽  
Si Wafer

Abstract Liquid cell transmission electron microscopy (LCTEM) enables imaging of dynamic processes in liquid with high spatial and temporal resolution. The widely used liquid cell (LC) consists of two stacking microchips with a thin wet sample sandwiched between them. The vertically overlapped electron-transparent membrane windows on the microchips provide passage for the electron beam. However, microchips with imprecise dimensions usually cause poor alignment of the windows and difficulty in acquiring high-quality images. In this study, we developed a new and efficient microchip fabrication process for LCTEM with a large viewing area (180 µm × 40 µm) and evaluated the resultant LC. The new positioning reference marks on the surface of the Si wafer dramatically improve the precision of dicing the wafer, making it possible to accurately align the windows on two stacking microchips. The precise alignment led to a liquid thickness of 125.6 nm close to the edge of the viewing area. The performance of our LC was demonstrated by in situ transmission electron microscopy imaging of the dynamic motions of 2-nm Pt particles. This versatile and cost-effective microchip production method can be used to fabricate other types of microchips for in situ electron microscopy.

scholarly journals Direct TEM observation of the “acanthite α-Ag2S–argentite β-Ag2S” phase transition in a silver sulfide nanoparticle

2019 ◽  
Vol 1 (4) ◽  
pp. 1581-1588 ◽  
Author(s):  
S. I. Sadovnikov ◽  
E. Yu. Gerasimov
Keyword(s):  
Electron Microscopy ◽  
Phase Transition ◽  
Transmission Electron Microscopy ◽  
Silver Sulfide ◽  
Transmission Electron ◽  
Silver Sulfide Nanoparticles ◽  
Microscopy Method ◽  
Electron Microscopy Method ◽  
First Time

For the first time, the α-Ag2S (acanthite)–β-Ag2S (argentite) phase transition in a single silver sulfide nanoparticles has been observed in situ using a high-resolution transmission electron microscopy method in real time.

Multimodal Optical Nanoprobe for Advanced In-Situ Electron Microscopy

2012 ◽  
Vol 20 (6) ◽  
pp. 32-37 ◽  
Author(s):  
Y. Zhu ◽  
M. Milas ◽  
M.-G. Han ◽  
J.D. Rameau ◽  
M. Sfeir
Keyword(s):  
Electron Microscopy ◽  
Driving Forces ◽  
Atomic Scale ◽  
Magnetic Domains ◽  
Photovoltaic Devices ◽  
Electromagnetic Devices ◽  
In Situ Electron Microscopy ◽  
Electric And Magnetic Fields ◽  
Anions And Cations

In-situ electron microscopy has gained considerable attention in recent years. It provides a “live” view of a material or device under study at various length scales. For example, by heating or cooling a sample one can study structural change at the atomic scale to understand the driving forces and mechanisms of phase transitions. By applying electric and magnetic fields on a ferroelectric or magnetic architecture in operation, one can directly observe how electric and magnetic domains switch, how anions and cations shift their positions, and how spins change their configuration across a domain wall, aiding the development of better electromagnetic devices. In the study of photovoltaic devices and junctions, a major challenge is to directly correlate light-induced electric currents with local structural inhomogeneities and dynamics. Such a capability would allow us to evaluate the performance of individual p-n junctions and to improve optoelectronic efficiency.

In Situ Electron Microscopy Mechanical Testing of Silicon Nanowires Using Electrostatically Actuated Tensile Stages

2010 ◽  
Vol 19 (3) ◽  
pp. 663-674 ◽  
Author(s):  
Dongfeng Zhang ◽  
Jean-Marc Breguet ◽  
Reymond Clavel ◽  
Vladimir Sivakov ◽  
Silke Christiansen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Mechanical Testing ◽  
Silicon Nanowires ◽  
Electrostatically Actuated ◽  
In Situ Electron Microscopy
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