High-Performance Multifaceted Piezoelectric Composite Nanogenerators for Weight-Monitoring Sensors

2021 ◽  
Author(s):  
Nagamalleswara Rao Alluri ◽  
Nirmal Prashanth Maria Joseph Raj ◽  
Gaurav Khandelwal ◽  
Sang-Jae Kim
Keyword(s):  
High Performance ◽  
Piezoelectric Composite ◽  
Weight Monitoring

scholarly journals High performance piezoelectric composite fabricated at ultra low temperature

2021 ◽  
pp. 109486
Author(s):  
Tuomo Siponkoski ◽  
Mikko Nelo ◽  
Niklas Ilonen ◽  
Jari Juuti ◽  
Heli Jantunen
Keyword(s):  
Low Temperature ◽  
High Performance ◽  
Piezoelectric Composite

High-performance piezoelectric composite nanogenerator based on Ag/(K,Na)NbO3 heterostructure

Nano Energy ◽  
2018 ◽  
Vol 50 ◽  
pp. 62-69 ◽  
Author(s):  
Yu Huan ◽  
Xiaoshan Zhang ◽  
Jianan Song ◽  
Yu Zhao ◽  
Tao Wei ◽  
...  
Keyword(s):  
High Performance ◽  
Piezoelectric Composite

Fabrication of 1-3 Cement-Based Piezoelectric Ultrasonic Sensors for NDE Applications

2014 ◽  
Vol 575 ◽  
pp. 580-584
Author(s):  
Xin Chun Xie ◽  
Jin Sen Zhang ◽  
Dong Yu Xu ◽  
Xiao Jing Guo ◽  
Fei Sha ◽  
...  
Keyword(s):  
Epoxy Resin ◽  
High Performance ◽  
Piezoelectric Materials ◽  
Tungsten Powder ◽  
Ultrasonic Sensor ◽  
Test Material ◽  
Piezoelectric Composite ◽  
Front Face ◽  
Sensing Element ◽  
Ultrasonic Sensors

This paper described fabrication and comparison of embedded ultrasonic sensors for NDE applications. A 1-3 cement-based piezoelectric composite was used as the sensing element of the ultrasonic sensor. As a front matching layer between test material and piezoelectric materials, cement/epoxy resin was selected. In order to make the backing materials for sensors had enough acoustic attenuation performance, the backing material of sensors doped with tungsten powder. When the mass ratio of tungsten/cement backing was two and the thickness of cement/epoxy resin front-face matching was 3mm, the 1-3 cement-based piezoelectric ultrasonic sensor showed a significant enhancement in both relative pulse-echo sensitivity and-6dB bandwidth. These promising results suggested the great potential for developing high-performance ultrasonic sensors using the 1-3 cement-based piezoelectric composite.

scholarly journals High-Performance 0-3 Type Niobate-Based Lead-Free Piezoelectric Composite Ceramics with ZnO Inclusions

2018 ◽  
Vol 10 (36) ◽  
pp. 30566-30573 ◽  
Author(s):  
Xiang Lv ◽  
Jun Li ◽  
Tian-Lu Men ◽  
Jiagang Wu ◽  
Xi-xiang Zhang ◽  
...  
Keyword(s):  
High Performance ◽  
Lead Free ◽  
Piezoelectric Composite ◽  
Composite Ceramics

“UNCONVENTIONAL HIGH PERFORMANCE PIEZOELECTRIC COMPOSITE ACTUATORS FOR MECHATRONIC APPLICATIONS”

2006 ◽  
Vol 39 (16) ◽  
pp. 445-448 ◽  
Author(s):  
Raino Petricevic ◽  
Martin Gurka ◽  
Herbert Friedmann
Keyword(s):  
High Performance ◽  
Piezoelectric Composite

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

Use of the Magnetostatic Analogue In Electromagnetic Lens Engineering

1970 ◽  
Vol 28 ◽  
pp. 360-361
Author(s):  
John W. Coleman
Keyword(s):  
Boundary Conditions ◽  
High Performance ◽  
Force Fields ◽  
Optical Design ◽  
Direct Conversion ◽  
Design Engineering ◽  
Design Data ◽  
Scalar Potentials ◽  
Geometric Elements ◽  
At Will

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.

Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

1991 ◽  
Vol 49 ◽  
pp. 466-467
Author(s):  
J W Steeds ◽  
R Vincent
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Small Diameter ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Good Crystallinity ◽  
Special Modification ◽  
Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

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