scholarly journals Polarized Raman Analysis of Polymer Chain Orientation in Ultrafine Individual Nanofibers with Variable Low Crystallinity

2018 ◽  
Vol 51 (21) ◽  
pp. 8746-8751 ◽  
Author(s):  
Dimitry Papkov ◽  
Christian Pellerin ◽  
Yuris A. Dzenis
Keyword(s):  
Polymer Chain ◽  
Raman Analysis ◽  
Chain Orientation ◽  
Polarized Raman ◽  
Low Crystallinity

scholarly journals Quantifying Polymer Chain Orientation in Strong and Tough Nanofibers with Low Crystallinity: Toward Next Generation Nanostructured Superfibers

ACS Nano ◽  
2019 ◽  
Vol 13 (5) ◽  
pp. 4893-4927 ◽  
Author(s):  
Dimitry Papkov ◽  
Nicolas Delpouve ◽  
Laurent Delbreilh ◽  
Steven Araujo ◽  
Taylor Stockdale ◽  
...  
Keyword(s):  
Polymer Chain ◽  
Next Generation ◽  
Chain Orientation ◽  
Low Crystallinity

Polarized Raman analysis of the molecular rearrangement and residual strain on the surface of retrieved polyethylene tibial plates

2011 ◽  
Vol 7 (3) ◽  
pp. 1150-1159 ◽  
Author(s):  
Leonardo Puppulin ◽  
Yasuhito Takahashi ◽  
Wenliang Zhu ◽  
Nobuhiko Sugano ◽  
Giuseppe Pezzotti
Keyword(s):  
Residual Strain ◽  
Molecular Rearrangement ◽  
Raman Analysis ◽  
Polarized Raman

Computational analysis of the orientation persistence length of the polymer chain orientation

2019 ◽  
Vol 21 (38) ◽  
pp. 21464-21472
Author(s):  
Falk Niefind ◽  
Andreas Neff ◽  
Stefan C. B. Mannsfeld ◽  
Axel Kahnt ◽  
Bernd Abel
Keyword(s):  
Organic Electronics ◽  
Polymer Chain ◽  
Computational Analysis ◽  
Persistence Length ◽  
Semiconducting Polymers ◽  
Chain Orientation ◽  
Nanoscale Morphology

Analyzing and interpreting the nanoscale morphology of semiconducting polymers is one of the key challenges for advancing in organic electronics.

Optical Anisotropy Studies of Sapphire by Raman Scattering and Spectroscopic Transmission Ellipsometry

1998 ◽  
Vol 512 ◽  
Author(s):  
H. Yao ◽  
C. H. Yan ◽  
S. P. Denbaars ◽  
J. M. Zavada
Keyword(s):  
Raman Scattering ◽  
Optical Anisotropy ◽  
Optical Axis ◽  
High Sensitivity ◽  
Incident Laser ◽  
Axis Orientation ◽  
Raman Analysis ◽  
Sapphire Substrates ◽  
Peak Intensity ◽  
Polarized Raman

ABSTRACTOptical anisotropy of sapphire have been studied by both polarized Raman scattering and transmission variable angle spectroscopic ellipsometry (TVASE). The polarized Raman effect was measured on both c-plane (0001) and a-plane (2110) sapphire substrates. Two TO phonons (379 and 431 cm−l) and four LO phonons (418, 450, 577, and 750 cm−1) were observed when the optical axis <c> is perpendicular to the polarization of the incident laser beam (for both c-plane and a-plane). While only two TO phonons (379 and 431cm−1) and two LO phonons (418 and 645 cm−1) can be seen when the optical axis is parallel to the polarization for an a-plane sapphire. The optical axis of the a-plane sapphire can then be quickly determined by either maximizing or minimizing the 645 LO peak intensity with about ±10° error. TVASE measurements were carried out in the energy range of 0.75eV to 5.8eV at room temperature. Sizable off-diagonal Jones matrix elements Apst, and Aspt can be detected even with the optical axis 1° off the X-axis. This indicates that TVASE has a high sensitivity to optical anisotropy. By minimizing these off-diagonal elements and combining the Raman analysis, the optical axis orientation of an a-plane or m-plane (0110) sapphire can therefore be fully determined with an error of less than 1°.

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