Systematic Control of Self-Seeding Crystallization Patterns of Poly(ethylene oxide) in Thin Films

2018 ◽  
Vol 51 (5) ◽  
pp. 1626-1635 ◽  
Author(s):  
Binghua Wang ◽  
Shaohua Tang ◽  
Yan Wang ◽  
Changyu Shen ◽  
Renate Reiter ◽  
...  
2019 ◽  
Author(s):  
Paul Markus ◽  
Daniel E Martínez-Tong ◽  
Georg Papastavrou ◽  
Angel Alegria

<div><div><div><p>The effect of humidity on the ionic transport in the amorphous phase of poly(ethylene oxide) thin films has been studied by via local dielectric spectroscopy. We explored a controlled humidity range between 15 %RH and 50 %RH. AFM-based local dielectric imaging allowed to obtain simultaneously the thin films topography and the corresponding dielectric contrast maps. No humidity effect on the film topography was observed whereas large variation of the dielectric signal could be detected. In addition, we observed a clear dielectric contrast in different locations on the thin film surface. At selected regions with high contrast in the dielectric maps, we performed nanoDielectric Spectroscopy (nDS) measurements covering the frequency range from 10 Hz to 100 kHz. By modeling these spectroscopy results, we quantified the conductivity of the amorphous phase of the semicrystalline poly(ethylene oxide) films. The crystalline fraction of the PEO thin films was extracted and found to be about 36%, independently of humidity. However, the average conductivity increased drastically from 2×10-10 to 5×10-9 S/cm, by changing environmental humidity in the explore %RH range.</p></div></div></div>


Soft Matter ◽  
2020 ◽  
Vol 16 (13) ◽  
pp. 3203-3208 ◽  
Author(s):  
Paul Markus ◽  
Daniel E. Martínez-Tong ◽  
Georg Papastavrou ◽  
Angel Alegria

The laterally-resolved conductivity of PEO thin films increases with relative humidity, as determined by local dielectric spectroscopy: an AFM-based electrical technique.


2017 ◽  
Vol 146 (24) ◽  
pp. 244903 ◽  
Author(s):  
Iain McKenzie ◽  
David L. Cortie ◽  
Masashi Harada ◽  
Robert F. Kiefl ◽  
C. D. Philip Levy ◽  
...  

1999 ◽  
Vol 32 (8) ◽  
pp. 2721-2730 ◽  
Author(s):  
Stanley Affrossman ◽  
Thomas Kiff ◽  
Scott A. O'Neill ◽  
Richard A. Pethrick ◽  
Randal W. Richards

2018 ◽  
Vol 10 (5) ◽  
pp. 05016-1-05016-4
Author(s):  
Mohammed Al-Tweissi ◽  
◽  
Mou'ad A. Tarawneh ◽  
M. Q. Owaidat ◽  
Monther Alsboul ◽  
...  

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