Unique Crystal Orientation of Poly(ethylene oxide) Thin Films by Crystallization Using a Thermal Gradient

2017 ◽  
Vol 50 (15) ◽  
pp. 5877-5891 ◽  
Author(s):  
Gabin Gbabode ◽  
Maxime Delvaux ◽  
Guillaume Schweicher ◽  
Jens W. Andreasen ◽  
Martin M. Nielsen ◽  
...  
Keyword(s):  
Thin Films ◽  
Ethylene Oxide ◽  
Thermal Gradient ◽  
Crystal Orientation ◽  
Oxide Thin Films ◽  
Poly Ethylene Oxide ◽  
Poly Ethylene

scholarly journals Effect of Environmental Humidity on the Ionic Transport of Poly(ethylene Oxide) Thin Films by Local Dielectric Spectroscopy

2019 ◽  
Author(s):  
Paul Markus ◽  
Daniel E Martínez-Tong ◽  
Georg Papastavrou ◽  
Angel Alegria
Keyword(s):  
Thin Films ◽  
Ethylene Oxide ◽  
Amorphous Phase ◽  
Dielectric Spectroscopy ◽  
Ionic Transport ◽  
Oxide Thin Films ◽  
Environmental Humidity ◽  
Dielectric Contrast ◽  
Poly Ethylene Oxide ◽  
Poly Ethylene

<div><div><div><p>The effect of humidity on the ionic transport in the amorphous phase of poly(ethylene oxide) thin films has been studied by via local dielectric spectroscopy. We explored a controlled humidity range between 15 %RH and 50 %RH. AFM-based local dielectric imaging allowed to obtain simultaneously the thin films topography and the corresponding dielectric contrast maps. No humidity effect on the film topography was observed whereas large variation of the dielectric signal could be detected. In addition, we observed a clear dielectric contrast in different locations on the thin film surface. At selected regions with high contrast in the dielectric maps, we performed nanoDielectric Spectroscopy (nDS) measurements covering the frequency range from 10 Hz to 100 kHz. By modeling these spectroscopy results, we quantified the conductivity of the amorphous phase of the semicrystalline poly(ethylene oxide) films. The crystalline fraction of the PEO thin films was extracted and found to be about 36%, independently of humidity. However, the average conductivity increased drastically from 2×10-10 to 5×10-9 S/cm, by changing environmental humidity in the explore %RH range.</p></div></div></div>

scholarly journals Effect of environmental humidity on the ionic transport of poly(ethylene oxide) thin films, investigated by local dielectric spectroscopy

Soft Matter ◽  
2020 ◽  
Vol 16 (13) ◽  
pp. 3203-3208 ◽  
Author(s):  
Paul Markus ◽  
Daniel E. Martínez-Tong ◽  
Georg Papastavrou ◽  
Angel Alegria
Keyword(s):  
Thin Films ◽  
Relative Humidity ◽  
Ethylene Oxide ◽  
Dielectric Spectroscopy ◽  
Ionic Transport ◽  
Oxide Thin Films ◽  
Environmental Humidity ◽  
Poly Ethylene Oxide ◽  
Poly Ethylene

The laterally-resolved conductivity of PEO thin films increases with relative humidity, as determined by local dielectric spectroscopy: an AFM-based electrical technique.

Dielectric properties of plasma polymerized poly(ethylene oxide) thin films

2016 ◽  
Vol 616 ◽  
pp. 279-286 ◽  
Author(s):  
Sahin Yakut ◽  
Hulusi Kemal Ulutas ◽  
Iurii Melnichuk ◽  
Andrei Choukourov ◽  
Hynek Biederman ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Ethylene Oxide ◽  
Oxide Thin Films ◽  
Poly Ethylene Oxide ◽  
Poly Ethylene

Growth of ordered poly(ethylene-oxide) thin films from solutions: an SFM study

2004 ◽  
Vol 147 (1-3) ◽  
pp. 123-125 ◽  
Author(s):  
Laura Sardone ◽  
Giovanni Marletta ◽  
Franco Cacialli ◽  
Paolo Samorì
Keyword(s):  
Thin Films ◽  
Ethylene Oxide ◽  
Oxide Thin Films ◽  
Poly Ethylene Oxide ◽  
Poly Ethylene

Controlling of crystallite orientation for poly(ethylene oxide) thin films with cellulose single nano-fibers

Polymer ◽  
2014 ◽  
Vol 55 (16) ◽  
pp. 4401-4404 ◽  
Author(s):  
Miki Noda Fukuya ◽  
Kazunobu Senoo ◽  
Masaru Kotera ◽  
Mamoru Yoshimoto ◽  
Osami Sakata
Keyword(s):  
Thin Films ◽  
Ethylene Oxide ◽  
Oxide Thin Films ◽  
Crystallite Orientation ◽  
Poly Ethylene Oxide ◽  
Poly Ethylene

scholarly journals The thickness dependence of dielectric properties in the plasma polymer thin films

2018 ◽  
Vol 96 (7) ◽  
pp. 792-795 ◽  
Author(s):  
Kemal Ulutaş
Keyword(s):  
Thin Films ◽  
Dielectric Loss ◽  
Ethylene Oxide ◽  
Bottom Layer ◽  
Plasma Polymer ◽  
Dead Layer ◽  
Frequency Range ◽  
Oxide Thin Films ◽  
Poly Ethylene Oxide ◽  
Poly Ethylene

In this study, the results of dielectric spectroscopy of plasma polymerized poly(ethylene oxide) thin films are presented. The films were deposited by plasma-assisted physical vapour deposition at radio-frequency plasma discharge power of 5 W, and film thicknesses of 20, 100, and 250 nm. Dielectric measurements of the films were performed in the frequency range of 10−1–107 Hz and temperature was scanned between 173 and 353 K. The dielectric constant ([Formula: see text]) and dielectric loss ([Formula: see text]) of plasma polymerized poly(ethylene oxide) thin films were calculated by measuring capacitance (C) and dielectric loss factor (tanδ). It was observed that there were two relaxation mechanisms in the investigated frequency range. These were called α and β relaxations. These relaxations shift toward higher frequencies with increasing temperature. Moreover, α-relaxation starts to appear at different temperatures. This shows the difference between the polarizability abilities of samples at the same temperature and same frequencies. The reason for this behavior can be expressed by the dead layer concept, which is a result of good adhesion of the bottom layer of plasma polymer to the substrate. In light of these interpretations, with thinner samples it is possible to have structurally similar thin films like thin films deposited at high plasma power. A thinner film may support more transparency and these thinner films may be effective as coverage of optical devices, such as lenses, visors, etc.

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