scholarly journals Study of Damage Mechanisms of Amorphous and Low Semicrystalline Polymers under Tensile Deformation by Ultrasmall-Angle X-ray Scattering

2020 ◽  
Vol 53 (13) ◽  
pp. 5538-5559
Author(s):  
Stéphanie Djukic ◽  
Anthony Bocahut ◽  
Jérôme Bikard ◽  
Didier R. Long
Keyword(s):  
Tensile Deformation ◽  
Semicrystalline Polymers ◽  
Damage Mechanisms ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Damage Mechanisms of Plasticized Cellulose Acetate under Tensile Deformation Studied by Ultrasmall-Angle X-ray Scattering

2019 ◽  
Vol 52 (17) ◽  
pp. 6613-6632 ◽  
Author(s):  
Agathe Charvet ◽  
Caroll Vergelati ◽  
Paul Sotta ◽  
Didier R. Long
Keyword(s):  
Cellulose Acetate ◽  
Tensile Deformation ◽  
Damage Mechanisms ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals In Situ Synchrotron X-ray Study of the Mechanical Properties of Pure Mg Produced by Powder Metallurgy

Metals ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 1198
Author(s):  
Li Li ◽  
Leyun Wang ◽  
Jie Wang ◽  
Huan Zhang ◽  
Qingchun Zhu ◽  
...  
Keyword(s):  
Powder Metallurgy ◽  
Tensile Deformation ◽  
Line Broadening ◽  
X Ray ◽  
X Ray Scattering ◽  
Type Dislocation ◽  
Diffraction Patterns ◽  
Saxs Analysis ◽  
Ray Scattering

In this study, in situ synchrotron X-ray experiments with wide-angle X-ray scattering (WAXS) and small-angle X-ray scattering (SAXS) detectors were performed on two pure magnesium materials produced by powder metallurgy. According to SAXS analysis, each of the two materials has a porosity of less than 0.5%. Line broadening analysis was performed on diffraction patterns collected by WAXS to analyze the dislocation evolution during material deformation. In both materials, <a>-type dislocation activities dominate the tensile deformation. The influence of grain size and texture on the different tensile behaviors of these two materials is also discussed.

Grazing-incidence X-ray scattering of lamellar thin films

2019 ◽  
Vol 52 (2) ◽  
pp. 247-251
Author(s):  
Detlef-M. Smilgies
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Small Molecules ◽  
Film Studies ◽  
Grazing Incidence ◽  
Semicrystalline Polymers ◽  
X Ray ◽  
X Ray Scattering ◽  
Incident Plane ◽  
Ray Scattering

Recently, surface and thin-film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X-ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film.

The Study of Cavitation in HDPE Using Time Resolved Synchrotron X-ray Scattering During Tensile Deformation

2006 ◽  
Vol 236 (1) ◽  
pp. 241-248 ◽  
Author(s):  
K. Schneider ◽  
S. Trabelsi ◽  
N.E. Zafeiropoulos ◽  
R. Davies ◽  
Chr. Riekel ◽  
...  
Keyword(s):  
Tensile Deformation ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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