scholarly journals Integrating Ab Initio Simulations and X-ray Photoelectron Spectroscopy: Toward A Realistic Description of Oxidized Solid/Liquid Interfaces

2017 ◽  
Vol 9 (1) ◽  
pp. 194-203 ◽  
Author(s):  
Tuan Anh Pham ◽  
Xueqiang Zhang ◽  
Brandon C. Wood ◽  
David Prendergast ◽  
Sylwia Ptasinska ◽  
...  
Keyword(s):  
Ab Initio ◽  
Photoelectron Spectroscopy ◽  
Liquid Interfaces ◽  
X Ray ◽  
Ab Initio Simulations ◽  
Realistic Description ◽  
Solid Liquid

Solid-liquid interfaces studied with synchrotron-based ambient pressure X-ray photoelectron spectroscopy

2021 ◽  
Author(s):  
David Starr ◽  
Marco Favaro ◽  
Pip Clark ◽  
Rossella Yivlialin ◽  
Maryline Ralaiarisoa ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
Liquid Interfaces ◽  
X Ray ◽  
Solid Liquid

scholarly journals In situ X-ray photoelectron spectroscopy of electrochemically active solid-gas and solid-liquid interfaces

2017 ◽  
Vol 221 ◽  
pp. 10-17 ◽  
Author(s):  
Axel Knop-Gericke ◽  
Verena Pfeifer ◽  
Juan-Jesus Velasco-Velez ◽  
Travis Jones ◽  
Rosa Arrigo ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Liquid Interfaces ◽  
X Ray ◽  
Electrochemically Active ◽  
Solid Liquid

scholarly journals Stochastic Analysis of Electron Transfer and Mass Transport in Confined Solid/Liquid Interfaces

Surfaces ◽  
2020 ◽  
Vol 3 (3) ◽  
pp. 392-407
Author(s):  
Marco Favaro
Keyword(s):  
Electron Transfer ◽  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
Chemical Properties ◽  
Liquid Films ◽  
Liquid Interfaces ◽  
Electrical Potentials ◽  
Voltammetric Behavior ◽  
Current Densities ◽  
Solid Liquid

Molecular-level understanding of electrified solid/liquid interfaces has recently been enabled thanks to the development of novel in situ/operando spectroscopic tools. Among those, ambient pressure photoelectron spectroscopy performed in the tender/hard X-ray region and coupled with the “dip and pull” method makes it possible to simultaneously interrogate the chemical composition of the interface and built-in electrical potentials. On the other hand, only thin liquid films (on the order of tens of nanometers at most) can be investigated, since the photo-emitted electrons must travel through the electrolyte layer to reach the photoelectron analyzer. Due to the challenging control and stability of nm-thick liquid films, a detailed experimental electrochemical investigation of such thin electrolyte layers is still lacking. This work therefore aims at characterizing the electrochemical behavior of solid/liquid interfaces when confined in nanometer-sized regions using a stochastic simulation approach. The investigation was performed by modeling (i) the electron transfer between a solid surface and a one-electron redox couple and (ii) its diffusion in solution. Our findings show that the well-known thin-layer voltammetry theory elaborated by Hubbard can be successfully applied to describe the voltammetric behavior of such nanometer-sized interfaces. We also provide an estimation of the current densities developed in these confined interfaces, resulting in values on the order of few hundreds of nA·cm−2. We believe that our results can contribute to the comprehension of the physical/chemical properties of nano-interfaces, thereby aiding to a better understanding of the capabilities and limitations of the “dip and pull” method.

The Study of Solid/Liquid Interfaces with X-ray Standing Waves

Science ◽  
1990 ◽  
Vol 250 (4977) ◽  
pp. 69-74 ◽  
Author(s):  
H. D. Abruna ◽  
G. M. Bommarito ◽  
D. Acevedo
Keyword(s):  
Standing Waves ◽  
Liquid Interfaces ◽  
X Ray ◽  
Solid Liquid
Sign in / Sign up

Export Citation Format

Share Document