Copper Oxidation on Pt(111)—More than a Surface Oxide?

2019 ◽  
Vol 123 (44) ◽  
pp. 26939-26946 ◽  
Author(s):  
Alexander Gloystein ◽  
Niklas Nilius
2001 ◽  
Vol 87 (12) ◽  
pp. 756-761 ◽  
Author(s):  
Kiyotaka ITO ◽  
Masahiro KOIKE
Keyword(s):  

1998 ◽  
Author(s):  
Leo G. Henry ◽  
J.H. Mazur

Abstract The task of differentiating precisely between EOS and ESD failures continues to be a challenging one for Failure Analysis Engineers. Electrical OverStress (EOS) failures on the die surface (burnt/fused metallization) of an IC can be characterized mainly by the discoloration at the site of the failures. This is in direct contrast to the lack of discoloration characteristic of ESD failures, which occur almost exclusively below the die surface (oxide and junction failures). To aid in this distinction, this paper attempts to present the underlying physics behind the discoloration produced in the EOS failures. For the EOS failures, the metal fuses due to the longer pulse widths (sec to msec), while for the ESD failures, the silicon melts because of the shorter pulse widths (< < 500 nsec) and higher energy. After EOS, the aluminum surface becomes dark and rough and the oxide in the surrounding area becomes deformed and distorted, resulting in the discoloration observed in the light microscope. This EOS discoloration could be due to one or more of the following: 1) morphological and structural changes at the metal/glass interface and the glass itself; 2) changes in the thickness and scattering behavior of the glass and metal in the failed areas.


1963 ◽  
Vol 110 (6) ◽  
pp. 680 ◽  
Author(s):  
H. S. Isaacs ◽  
J. S. Llewelyn Leach
Keyword(s):  

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
P. Winkler ◽  
J. Zeininger ◽  
Y. Suchorski ◽  
M. Stöger-Pollach ◽  
P. Zeller ◽  
...  

AbstractScanning photoelectron microscopy (SPEM) and photoemission electron microscopy (PEEM) allow local surface analysis and visualising ongoing reactions on a µm-scale. These two spatio-temporal imaging methods are applied to polycrystalline Rh, representing a library of well-defined high-Miller-index surface structures. The combination of these techniques enables revealing the anisotropy of surface oxidation, as well as its effect on catalytic hydrogen oxidation. In the present work we observe, using locally-resolved SPEM, structure-sensitive surface oxide formation, which is summarised in an oxidation map and quantitatively explained by the novel step density (SDP) and step edge (SEP) parameters. In situ PEEM imaging of ongoing H2 oxidation allows a direct comparison of the local reactivity of metallic and oxidised Rh surfaces for the very same different stepped surface structures, demonstrating the effect of Rh surface oxides. Employing the velocity of propagating reaction fronts as indicator of surface reactivity, we observe a high transient activity of Rh surface oxide in H2 oxidation. The corresponding velocity map reveals the structure-dependence of such activity, representing a direct imaging of a structure-activity relation for plenty of well-defined surface structures within one sample.


2021 ◽  
Vol 46 (24) ◽  
pp. 13082-13087
Author(s):  
Ki Beom Park ◽  
Tae-Wook Na ◽  
Young Do Kim ◽  
Jae-Young Park ◽  
Jang-Won Kang ◽  
...  

2019 ◽  
Vol 166 (11) ◽  
pp. C3376-C3388 ◽  
Author(s):  
Zuocheng Wang ◽  
Francesco Di-Franco ◽  
Antoine Seyeux ◽  
Sandrine Zanna ◽  
Vincent Maurice ◽  
...  

Nano Energy ◽  
2017 ◽  
Vol 41 ◽  
pp. 731-737 ◽  
Author(s):  
Xinghua Chang ◽  
Zewei Xie ◽  
Zhiliang Liu ◽  
Xinyao Zheng ◽  
Jie Zheng ◽  
...  

2012 ◽  
Vol 87 (5-6) ◽  
pp. 580-583 ◽  
Author(s):  
Yasuhisa Oya ◽  
Makoto Kobayashi ◽  
Junya Osuo ◽  
Masato Suzuki ◽  
Akiko Hamada ◽  
...  

1988 ◽  
Vol 19 (5) ◽  
pp. 1372-1374 ◽  
Author(s):  
P. P. Pronko ◽  
R. S. Bhattacharya ◽  
J. J. Kleek ◽  
F. H. Froes

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