scholarly journals Negligible Electronic Interaction between Photoexcited Electron–Hole Pairs and Free Electrons in Phosphorus–Boron Co-Doped Silicon Nanocrystals

2018 ◽  
Vol 122 (11) ◽  
pp. 6397-6404 ◽  
Author(s):  
Rens Limpens ◽  
Minoru Fujii ◽  
Nathan R. Neale ◽  
Tom Gregorkiewicz
2017 ◽  
Vol 178 ◽  
pp. 298-303 ◽  
Author(s):  
A. Mazurak ◽  
R. Mroczyński ◽  
J. Jasiński ◽  
D. Tanous ◽  
B. Majkusiak ◽  
...  

2015 ◽  
Vol 120 (1) ◽  
pp. 195-200 ◽  
Author(s):  
Masato Sasaki ◽  
Shinya Kano ◽  
Hiroshi Sugimoto ◽  
Kenji Imakita ◽  
Minoru Fujii

2012 ◽  
Vol 14 (4) ◽  
Author(s):  
Yeshi Ma ◽  
Xiaobo Chen ◽  
Xiaodong Pi ◽  
Deren Yang

2020 ◽  
Vol 222 ◽  
pp. 217-239 ◽  
Author(s):  
Stefano Ossicini ◽  
Ivan Marri ◽  
Michele Amato ◽  
Maurizia Palummo ◽  
Enric Canadell ◽  
...  

Results from ab initio calculations for singly- and co- doped Si nanocrystals and nanowires are presented.


2020 ◽  
Vol 222 ◽  
pp. 201-216
Author(s):  
Gregory F. Pach ◽  
Gerard M. Carroll ◽  
Hanyu Zhang ◽  
Nathan R. Neale

We explore the effect of ligand binding groups on the photoluminescent properties of phosphorus–boron co-doped silicon nanocrystals (PB:Si NCs) by exploiting X-type (covalent) and L-type (Lewis donor molecule) bonding interactions.


2000 ◽  
Vol 638 ◽  
Author(s):  
Minoru Fujii ◽  
Atsushi Mimura ◽  
Shinji Hayashi ◽  
Dmitri Kovalev ◽  
Frederick Koch

AbstractEffects of impurity (P and B) doping on the photoluminescence (PL) properties of Si nanocrystals (nc-Si) in SiO2 thin films are studied. It is shown that with increasing P concentration, PL intensity first increases and then decreases. In the P concentration range where PL intensity increases, quenching of the defect-related PL is observed, suggesting that dangling-bond defects are passivated by P doping. On the other hand, in the range where PL intensity decreases, optical absorptiondue to the intravalley transitions of free electrons generated by P doping appears. The generation of free electrons andthe resultant three-body Auger recombination of electron-hole pairs is considered to be responsible for theobserved PL quenching. In the case of B doping, the behavior is much different. With increasing B concentration, PL intensity decreases monotonously. By combining the results obtained for P and B doped samples, theeffects of donor and acceptor impurities on the PL properties of nc-Si are discussed.


2014 ◽  
Vol 105 (18) ◽  
pp. 183110 ◽  
Author(s):  
Shu Zhou ◽  
Yi Ding ◽  
Xiaodong Pi ◽  
Tomohiro Nozaki

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