Vacuum Chromatography of Tl on SiO2 at the Single-Atom Level

2016 ◽  
Vol 120 (13) ◽  
pp. 7122-7132 ◽  
Author(s):  
Patrick Steinegger ◽  
Masato Asai ◽  
Rugard Dressler ◽  
Robert Eichler ◽  
Yusuke Kaneya ◽  
...  
Keyword(s):  
Single Atom ◽  
Atom Level

scholarly journals Atomic Electron Tomography: Probing 3D Structure and Material Properties at the Single-Atom Level

2017 ◽  
Vol 23 (S1) ◽  
pp. 1886-1887
Author(s):  
Yongsoo Yang ◽  
Chien-Chun Chen ◽  
M. C. Scott ◽  
Colin Ophus ◽  
Rui Xu ◽  
...  
Keyword(s):  
Material Properties ◽  
Electron Tomography ◽  
3D Structure ◽  
Atomic Electron ◽  
Single Atom ◽  
Atom Level

Single-atom electron microscopy for energy-related nanomaterials

2020 ◽  
Vol 8 (32) ◽  
pp. 16142-16165 ◽  
Author(s):  
Mingquan Xu ◽  
Aowen Li ◽  
Meng Gao ◽  
Wu Zhou
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Atomic Resolution ◽  
Single Atom ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Resolution Imaging ◽  
Imaging And Spectroscopy ◽  
Atom Level

The advances in aberration correction have enabled atomic-resolution imaging and spectroscopy in scanning transmission electron microscopy (STEM) under low primary voltages and pushed their detection limit down to the single-atom level.

scholarly journals Imaging Nucleation, Growth and Disorder at the Single-atom Level by Atomic Electron Tomography (AET)

2020 ◽  
Vol 26 (S2) ◽  
pp. 1848-1850
Author(s):  
Peter Ercius ◽  
Jihan Zhou ◽  
Yongsoo Yang ◽  
Yao Yang ◽  
Dennis Kim ◽  
...  
Keyword(s):  
Electron Tomography ◽  
Atomic Electron ◽  
Single Atom ◽  
Atom Level ◽  
Nucleation Growth

The study of rhenium pentacarbonyl complexes using single-atom chemistry in the gas phase

2019 ◽  
Vol 21 (13) ◽  
pp. 7147-7154
Author(s):  
Yang Wang ◽  
Shiwei Cao ◽  
Jicai Zhang ◽  
Fangli Fan ◽  
Jie Yang ◽  
...  
Keyword(s):  
Gas Phase ◽  
Single Atom ◽  
Atom Level ◽  
Atom Chemistry

Two experiments prove Re pentacarbonyl could exist stably in the gas phase at the single-atom level.

Three-dimensional reconstruction of atomic-scale composition with the position-sensitive atom probe

1992 ◽  
Vol 50 (2) ◽  
pp. 1478-1479
Author(s):  
G.D.W. Smith ◽  
A. Cerezo ◽  
C.R.M. Grovenor ◽  
T.J. Godfrey ◽  
R.P. Setna
Keyword(s):  
Mass Spectrometer ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Single Atom ◽  
Small Aperture ◽  
Dimensional Reconstruction ◽  
Position Sensitive ◽  
Atom Level ◽  
Scale Composition

The combination of a field ion microscope with a time-of-flight mass spectrometer provides the capability for chemical microanalysis at the single atom level. Such an instrument is termed an Atom Probe. Conventionally, the connection between the microscope and the mass spectrometer is made via a small aperture hole in the imaging screen. This defines a region on the specimen, typically about 2nm across, from which the analysis is obtained. The disadvantage of this arrangement is that other regions of the specimen cannot be examined, as ions from all but the selected area strike the image screen and therefore do not pass into the mass spectrometer. In order to overcome this problem, we have developed a version of the Atom Probe which incorporates a wide-angle position sensitive detector system. This instrument, which we have termed the POSAP, is shown schematically in figure 1. Typically, the field of view in this instrument is about 20nm across. The number of ions collected per atom layer removed from the specimen surface is therefore approximately 5,000.

Advances in Parallel-Detection EELS

1990 ◽  
Vol 48 (2) ◽  
pp. 76-77
Author(s):  
O.L. Krivanek ◽  
N. Dellby ◽  
A.J. Gubbens ◽  
M.K. Kundmann ◽  
M.L. Leber ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Single Atom ◽  
Statistical Fluctuation ◽  
Parallel Detection ◽  
Routine Basis ◽  
Atom Level ◽  
New Applications ◽  
User Friendly ◽  
Electron Energy Loss ◽  
Better Than

Parallel-detection electron energy-loss spectrometers (PEELS) now routinely provide spectra in which the main source of noise is the statistical fluctuation in the number of arriving electrons (i.e., they have DQE > 0.5), achieve an energy resolution which is more than 90% limited by the electron microscope gun, and are fairly easy to operate. They have pushed the minimum detectable mass (MDM) obtainable by PEELS close to the single atom level, and have improved the minimum detectable mass fraction (MDF) so that it is now comparable or better than MDF detectable by EDXS even for elements as heavy as Fe. The attainable energy resolution is now 0.3-0.5 eV on a routine basis when the spectrometer is mounted on a cold field-emission gun (S)TEM operating at 100 kV (Fig. 1). This impressive progress has opened up an important question: where next?Our answer is three-fold: towards greater integration of EELS with other techniques of electron microscopy, towards new applications of the technique, and towards more quantitative and yet more user-friendly analysis of the results.

Generation of high-order harmonics and attosecond pulses

2019 ◽  
pp. 326-342
Author(s):  
Anne L’Huillier
Keyword(s):  
Extreme Ultraviolet ◽  
High Order ◽  
Intense Laser ◽  
Single Atom ◽  
Light Pulses ◽  
High Order Harmonic ◽  
Attosecond Pulses ◽  
Intense Laser Radiation ◽  
Atom Level ◽  
The Time Domain

The interaction of atoms with intense laser radiation leads to the generation of high-order harmonics of the laser field. In the time domain, this corresponds to a train of pulses in the extreme ultraviolet range and with attosecond duration. The first section introduces the physics of high-order harmonic generation and attosecond pulses on the single atom level while the second section discusses phase matching and propagation effects. The attosecond time scale is that of the electron motion in atoms and molecules. Attosecond light pulses are used to study, for example, the dynamics of atomic or molecular photoionization. The third section will present an interferometric method developed for measuring attosecond pulses and discuss some of the applications, in particular concerning photoionization dynamics.

scholarly journals Probing the Superfluid-to-Mott Insulator Transition at the Single-Atom Level

Science ◽  
2010 ◽  
Vol 329 (5991) ◽  
pp. 547-550 ◽  
Author(s):  
W. S. Bakr ◽  
A. Peng ◽  
M. E. Tai ◽  
R. Ma ◽  
J. Simon ◽  
...  
Keyword(s):  
Mott Insulator ◽  
Insulator Transition ◽  
Single Atom ◽  
Atom Level
Sign in / Sign up

Export Citation Format

Share Document