A Dynamic Transmission Line Model to Describe the Potential Dependence of Double-Layer Capacitances in Cyclic Voltammetry
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2007 ◽
Vol 164
(1)
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pp. 415-424
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Characterization of contact resistance of low-value resistor by transmission line model (TLM) method
2002 ◽
Vol 85
(3)
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pp. 16-22
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