Toward an Improved Method for Determining the Hamaker Constant of Solid Materials Using Atomic Force Microscopy. II. Dynamic Analysis and Preliminary Validation

2021 ◽  
Vol 125 (36) ◽  
pp. 20003-20013
Author(s):  
Michael C. Stevenson ◽  
Stephen P. Beaudoin ◽  
David S. Corti
Keyword(s):  
Atomic Force Microscopy ◽  
Dynamic Analysis ◽  
Hamaker Constant ◽  
Improved Method ◽  
Solid Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Preliminary Validation

scholarly journals Improved method for Mica functionalization used in single molecule imaging of DNA with atomic force microscopy

2016 ◽  
Vol 5 (5) ◽  
pp. 589-598 ◽  
Author(s):  
Hana Zapletalová ◽  
Jan Přibyl ◽  
Marcel Ambrož ◽  
Milan Vůjtek ◽  
Petr Skládal ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Single Molecule Imaging ◽  
Improved Method ◽  
Force Microscopy ◽  
Atomic Force

Dynamic analysis of an atomic force microscopy (AFM) including fractional-order

2016 ◽  
Author(s):  
Angelo Marcelo Tusset ◽  
Frederic Conrad Janzen ◽  
Vinícius Piccirillo ◽  
Jose Manoel Balthazar ◽  
Rodrigo Tumolin Rocha
Keyword(s):  
Atomic Force Microscopy ◽  
Dynamic Analysis ◽  
Fractional Order ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Use of Computer-Generated Holograms in Security Hologram Applications

2016 ◽  
Vol 53 (5) ◽  
pp. 54-63 ◽  
Author(s):  
A. Bulanovs ◽  
R. Bakanas
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Improved Method ◽  
Protective Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Computer Generated Holograms ◽  
Relief Phase ◽  
Scanning Electron

Abstract The article discusses the use of computer-generated holograms (CGHs) for the application as one of the security features in the relief-phase protective holograms. An improved method of calculating CGHs is presented, based on ray-tracing approach in the case of interference of parallel rays. Software is developed for the calculation of multilevel phase CGHs and their integration in the application of security holograms. Topology of calculated computer-generated phase holograms was recorded on the photoresist by the optical greyscale lithography. Parameters of the recorded microstructures were investigated with the help of the atomic-force microscopy (AFM) and scanning electron microscopy (SEM) methods. The results of the research have shown highly protective properties of the security elements based on CGH microstructures. In our opinion, a wide use of CGHs is very promising in the structure of complex security holograms for increasing the level of protection against counterfeit.

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