Probing the Electron Beam-Induced Structural Evolution of Halide Perovskite Thin Films by Scanning Transmission Electron Microscopy

2021 ◽  
Author(s):  
Xian-Gang Zhou ◽  
Chen-Quan Yang ◽  
Xiahan Sang ◽  
Wei Li ◽  
Li Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Scanning Transmission Electron Microscopy ◽  
Structural Evolution ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Halide Perovskite

scholarly journals Identification of interstratified mica and pyrophyllite monolayers within chlorite using advanced scanning/transmission electron microscopy

2019 ◽  
Vol 104 (10) ◽  
pp. 1436-1443
Author(s):  
Guanyu Wang ◽  
Hejing Wang ◽  
Jianguo Wen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Clay Minerals ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Chemical Compositions ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Abstract Interstratified clay minerals reflect the weathering degree and record climatic conditions and the pedogenic processes in the soil. It is hard to distinguish a few layers of interstratified clay minerals from the chlorite matrix, due to their similar two-dimensional tetrahedral-octahedral-tetrahedral (TOT) structure and electron-beam sensitive nature during transmission electron microscopy (TEM) imaging. Here, we used multiple advanced TEM techniques including low-dose high-resolution TEM (HRTEM), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging combined with energy-dispersive spectroscopic (EDS) mapping to study interstratified layers in a chlo-rite sample from Changping, Beijing, China. We demonstrated an interstratified mica or pyrophyllite monolayer could be well distinguished from the chlorite matrix by projected atomic structures, lattice spacings, and chemical compositions with advanced TEM techniques. Further investigation showed two different transformation mechanisms from mica or pyrophyllite to chlorite: either a 4 Å increase or decrease in the lattice spacing. This characterization approach can be extended to the studies of other electron-beam sensitive minerals.

Scanning Transmission Electron Microscopy Evidences Of Interstitial And Substitutional Oxygen In MBE Grown Fe1+xTe Thin Films And Emergence Of Superconductivity

2012 ◽  
Vol 18 (S2) ◽  
pp. 1456-1457
Author(s):  
H. Hu ◽  
M. Zheng ◽  
J.N. Eckstein ◽  
J. Zuo
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM)

2017 ◽  
Vol 23 (4) ◽  
pp. 794-808 ◽  
Author(s):  
Ryan J. Wu ◽  
Anudha Mittal ◽  
Michael L. Odlyzko ◽  
K. Andre Mkhoyan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Angular Distribution ◽  
Electron Probe ◽  
Scanning Transmission Electron Microscopy ◽  
Probe Intensity ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

AbstractSub-angstrom scanning transmission electron microscopy (STEM) allows quantitative column-by-column analysis of crystalline specimens via annular dark-field images. The intensity of electrons scattered from a particular location in an atomic column depends on the intensity of the electron probe at that location. Electron beam channeling causes oscillations in the STEM probe intensity during specimen propagation, which leads to differences in the beam intensity incident at different depths. Understanding the parameters that control this complex behavior is critical for interpreting experimental STEM results. In this work, theoretical analysis of the STEM probe intensity reveals that intensity oscillations during specimen propagation are regulated by changes in the beam’s angular distribution. Three distinct regimes of channeling behavior are observed: the high-atomic-number (Z) regime, in which atomic scattering leads to significant angular redistribution of the beam; the low-Zregime, in which the probe’s initial angular distribution controls intensity oscillations; and the intermediate-Zregime, in which the behavior is mixed. These contrasting regimes are shown to exist for a wide range of probe parameters. These results provide a new understanding of the occurrence and consequences of channeling phenomena and conditions under which their influence is strengthened or weakened by characteristics of the electron probe and sample.

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