scholarly journals Healing of a Hole in a Carbon Nanotube under Electron Irradiation in High-Resolution Transmission Electron Microscopy

2021 ◽  
Vol 125 (2) ◽  
pp. 1523-1530
Author(s):  
Irina V. Lebedeva ◽  
Andrey M. Popov ◽  
Andrey A. Knizhnik
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Electron Irradiation ◽  
Transmission Electron

Site-specific cross-sectioning of carbon nanotube-to-metal junctions for high spatial resolution chemical and structural analysis

2002 ◽  
Vol 738 ◽  
Author(s):  
K. Dovidenko ◽  
N. L. Abramson ◽  
J. Rullan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Site Specific ◽  
Transmission Electron ◽  
Electron Energy Loss

ABSTRACTIn this study, we have demonstrated successful site-specific cross-sectioning of carbon-nanotube - metal junctions which provided samples suitable for high resolution transmission electron microscopy and electron energy loss spectroscopy. For the cross-sectioning, we have suggested a modified technique based on combination of the Focused Ion Beam (FIB) lift-out and the conventional Ar+ ion milling techniques. Electron-transparent cross-sections of multiwall carbon nanotubes showing no significant surface amorphization or Ga contamination (typical artifacts of conventional FIB lift-out technique) were obtained. High-resolution transmission electron microscopy and electron energy loss spectroscopy of a multi-wall carbon nanotube cross-section have been carried out.

A graphene oxide–carbon nanotube grid for high-resolution transmission electron microscopy of nanomaterials

2011 ◽  
Vol 22 (38) ◽  
pp. 385704 ◽  
Author(s):  
Lina Zhang ◽  
Haoxu Zhang ◽  
Ruifeng Zhou ◽  
Zhuo Chen ◽  
Qunqing Li ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Graphene Oxide ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Transmission Electron

Site-specific cross-sectioning of carbon nanotube-to-metal junctions for high spatial resolution chemical and structural analysis

2002 ◽  
Vol 761 ◽  
Author(s):  
K. Dovidenko ◽  
N. L. Abramson ◽  
J. Rullan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Site Specific ◽  
Transmission Electron ◽  
Electron Energy Loss

AbstractIn this study, we have demonstrated successful site-specific cross-sectioning of carbon-nanotube - metal junctions which provided samples suitable for high resolution transmission electron microscopy and electron energy loss spectroscopy. For the cross-sectioning, we have suggested a modified technique based on combination of the Focused Ion Beam (FIB) lift-out and the conventional Ar+ ion milling techniques. Electron-transparent cross-sections of multiwall carbon nanotubes showing no significant surface amorphization or Ga contamination (typical artifacts of conventional FIB lift-out technique) were obtained. High-resolution transmission electron microscopy and electron energy loss spectroscopy of a multi-wall carbon nanotube cross-section have been carried out.

Superaligned Carbon Nanotube Grid for High Resolution Transmission Electron Microscopy of Nanomaterials

Nano Letters ◽  
2008 ◽  
Vol 8 (8) ◽  
pp. 2564-2569 ◽  
Author(s):  
Lina Zhang ◽  
Chen Feng ◽  
Zhuo Chen ◽  
Liang Liu ◽  
Kaili Jiang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Transmission Electron

The Synthesis of Nitrigen Doped Carbon Nanotube with Different Catalyst

2011 ◽  
Vol 694 ◽  
pp. 266-269 ◽  
Author(s):  
Hai Ying Jin ◽  
Nai Ci Bing ◽  
Ling Ling Wang ◽  
Li Jun Wang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Vapor Deposition ◽  
Molecular Sieve ◽  
Chemical Vapor ◽  
Nitrogen Doped ◽  
Transmission Electron ◽  
Nitrogen Doped Carbon

Bamboo-like nitrogen-doped carbon (CNX) nanotubes have been synthesized by chemical vapor deposition at high reaction temperature of 850°C. The diethylamine has been used as carbon source and Fe/SBA-15 and Ni/SBA-15 have been used as molecular sieve catalyst. Transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM) observations showed that the diameter and the wall thickness of CNx nanotubes were increased with the change of catalyst from Fe/SBA-15 to Ni/SBA-15.

A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

1982 ◽  
Vol 40 ◽  
pp. 722-723 ◽  
Author(s):  
R. Gronsky
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulations ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

Improved quantification of curvature in high-resolution transmission electron microscopy lattice fringe micrographs of soots

Carbon ◽  
2017 ◽  
Vol 117 ◽  
pp. 174-181 ◽  
Author(s):  
Chang’an Wang ◽  
Thomas Huddle ◽  
Chung-Hsuan Huang ◽  
Wenbo Zhu ◽  
Randy L. Vander Wal ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Lattice Fringe ◽  
Transmission Electron
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