Characterization on Percolation of Nanostructured Silver Films by the Topological Properties of Spectroscopic Ellipsometric Parameter Trajectories
2020 ◽
Vol 124
(51)
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pp. 28306-28312
1974 ◽
Vol 32
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pp. 302-303
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1972 ◽
Vol 30
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pp. 634-635
1989 ◽
Vol 50
(7)
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pp. 725-731
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1950 ◽
Vol 11
(7)
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pp. 422-424
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Keyword(s):
2020 ◽
Vol 16
(2)
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pp. 190-195
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Keyword(s):