Independent Variation of Transition Temperature and Prefrozen Layer Thickness at the Prefreezing Transition

2020 ◽  
Vol 124 (48) ◽  
pp. 26184-26192
Author(s):  
Muhammad Tariq ◽  
Oleksandr Dolynchuk ◽  
Thomas Thurn-Albrecht
Keyword(s):  
Transition Temperature ◽  
Layer Thickness ◽  
Independent Variation

Reformulation of pairing theory

1988 ◽  
Vol 02 (05) ◽  
pp. 1101-1105 ◽  
Author(s):  
Miklos GULACSI ◽  
Zsolt GULACSI
Keyword(s):  
Transition Temperature ◽  
Size Effect ◽  
Layer Thickness ◽  
Short Communication ◽  
Cooper Pairing ◽  
Two Dimensional ◽  
Critical Transition ◽  
Critical Transition Temperature ◽  
Quantum Size ◽  
Natural Way

The original Cooper pairing theory is reformulated for electrons confined in a layer. This analysis is motivated by the quasi-two-dimensional character of the oxidic superconductors, in case of which the extension of the initial (3D) Cooper framework is practically impossible. By considering the electrons moving in a flat box, due to quantum size effect the properties of these oxidic superconductors can be explained in a natural way. In this short communication we will concentrate to the variation of the critical transition temperature due to the layer thickness and to the number of conduction (Cu-O) planes. The results are confirmed by the experiment. This being an evidence for the presence of the charge confinement effect in the oxidic superconductors.

Experimental Investigation of PolyJet 3D Printing Process: Effects of Orientation and Layer Thickness on Thermal Glass Transition Temperature

2019 ◽  
Author(s):  
Jackson Sanders ◽  
Xingjian Wei ◽  
Zhijian Pei
Keyword(s):  
Glass Transition ◽  
Transition Temperature ◽  
Glass Transition Temperature ◽  
Layer Thickness ◽  
Elastic Moduli ◽  
3D Printer ◽  
Limited Information ◽  
Control Factors ◽  
Full Color ◽  
Process Effects

Abstract The J750 PolyJet printer is the newest model of full-color and multi-material 3D printer from Stratasys. Currently, limited information is available about the effects of control factors on thermal glass transition temperature of parts printed by this printer. In this study, the effects of two control factors, printing orientation and layer thickness, on the thermal glass transition temperature (Tg) are investigated. The results suggest that both control factors significantly affect Tg. Specifically, samples printed using the high mix mode have higher elastic moduli than those printed using high quality mode. Larger values of elastic moduli directly lead to a higher thermal glass transition temperature, making the material more effective under relatively extreme temperatures and duress. These results would be valuable to researchers and practitioners who use the Polyjet 3D printer.

In situ Tensile Experiments at Low Temperatures on Niobium Single Crystals by H.V.E.M.

1975 ◽  
Vol 33 ◽  
pp. 58-59
Author(s):  
F. H. Louchet ◽  
L. P. Kubin
Keyword(s):  
Electron Microscope ◽  
Transition Temperature ◽  
Low Temperature ◽  
Slip System ◽  
Low Temperatures ◽  
Tensile Axis ◽  
Image Intensifier ◽  
Screw Dislocations ◽  
Source Operation

Experiments have been carried out on the 3 MeV electron microscope in Toulouse. The low temperature straining holder has been previously described Images given by an image intensifier are recorded on magnetic tape.The microtensile niobium samples are cut in a plane with the two operative slip directions [111] and lying in the foil plane. The tensile axis is near [011].Our results concern:- The transition temperature of niobium near 220 K: at this temperature and below an increasing difference appears between the mobilities of the screw and edge portions of dislocations loops. Source operation and interactions between screw dislocations of different slip system have been recorded.

Structure and Orientation of As Precipitates in LT-MBE Grown GaAs

1991 ◽  
Vol 49 ◽  
pp. 900-901 ◽  
Author(s):  
Alain Claverie ◽  
Zuzanna Liliental-Weber
Keyword(s):  
Transport Properties ◽  
Layer Thickness ◽  
Growth Temperature ◽  
Low Temperatures ◽  
Lattice Parameter ◽  
Crystalline Quality ◽  
Insulating Properties ◽  
Lt Gaas

GaAs layers grown by MBE at low temperatures (in the 200°C range, LT-GaAs) have been reported to have very interesting electronic and transport properties. Previous studies have shown that, before annealing, the crystalline quality of the layers is related to the growth temperature. Lowering the temperature or increasing the layer thickness generally results in some columnar polycrystalline growth. For the best “temperature-thickness” combinations, the layers may be very As rich (up to 1.25%) resulting in an up to 0.15% increase of the lattice parameter, consistent with the excess As. Only after annealing are the technologically important semi-insulating properties of these layers observed. When annealed in As atmosphere at about 600°C a decrease of the lattice parameter to the substrate value is observed. TEM studies show formation of precipitates which are supposed to be As related since the average As concentration remains almost unchanged upon annealing.

The structure of membranes and membrane proteins embedded in amorphous ice

1992 ◽  
Vol 50 (1) ◽  
pp. 432-433
Author(s):  
Uwe Lücken ◽  
Joachim Jäger
Keyword(s):  
Phase Transition ◽  
Transition Temperature ◽  
Membrane Proteins ◽  
Phase Transition Temperature ◽  
Lipid Vesicles ◽  
Freezing Stress ◽  
Amorphous Ice ◽  
Different Temperatures ◽  
Band Pass ◽  
Lipid Polymorphism

TEM imaging of frozen-hydrated lipid vesicles has been done by several groups Thermotrophic and lyotrophic polymorphism has been reported. By using image processing, computer simulation and tilt experiments, we tried to learn about the influence of freezing-stress and defocus artifacts on the lipid polymorphism and fine structure of the bilayer profile. We show integrated membrane proteins do modulate the bilayer structure and the morphology of the vesicles.Phase transitions of DMPC vesicles were visualized after freezing under equilibrium conditions at different temperatures in a controlled-environment vitrification system. Below the main phase transition temperature of 24°C (Fig. 1), vesicles show a facetted appearance due to the quasicrystalline areas. A gradual increase in temperature leads to melting processes with different morphology in the bilayer profile. Far above the phase transition temperature the bilayer profile is still present. In the band-pass-filtered images (Fig. 2) no significant change in the width of the bilayer profile is visible.

The stabilization of B.C.C. Cu in Cu/Nb nanolayered composites

1996 ◽  
Vol 54 ◽  
pp. 228-229
Author(s):  
H. Kung ◽  
A.J. Griffin ◽  
Y.C. Lu ◽  
K.E. Sickafus ◽  
T.E. Mitchell ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Layer Thickness ◽  
Volume Fraction ◽  
Ion Beam ◽  
High Strength ◽  
Cross Sectional ◽  
Metastable Structure ◽  
High Resolution Tem ◽  
Potential Improvement ◽  
Two Phases

Materials with compositionally modulated structures have gained much attention recently due to potential improvement in electrical, magnetic and mechanical properties. Specifically, Cu-Nb laminate systems have been extensively studied mainly due to the combination of high strength, and superior thermal and electrical conductivity that can be obtained and optimized for the different applications. The effect of layer thickness on the hardness, residual stress and electrical resistivity has been investigated. In general, increases in hardness and electrical resistivity have been observed with decreasing layer thickness. In addition, reduction in structural scale has caused the formation of a metastable structure which exhibits uniquely different properties. In this study, we report the formation of b.c.c. Cu in highly textured Cu/Nb nanolayers. A series of Cu/Nb nanolayered films, with alternating Cu and Nb layers, were prepared by dc magnetron sputtering onto Si {100} wafers. The nominal total thickness of each layered film was 1 μm. The layer thickness was varied between 1 nm and 500 nm with the volume fraction of the two phases kept constant at 50%. The deposition rates and film densities were determined through a combination of profilometry and ion beam analysis techniques. Cross-sectional transmission electron microscopy (XTEM) was used to examine the structure, phase and grain size distribution of the as-sputtered films. A JEOL 3000F high resolution TEM was used to characterize the microstructure.

A SIMPLE QUALITATIVE DETERMINATION OF JOSEPHSON TUNNEL JUNCTION PARAMETERS NEAR THE TRANSITION TEMPERATURE

1978 ◽  
Vol 39 (C6) ◽  
pp. C6-1232-C6-1233 ◽  
Author(s):  
N. F. Pedersen ◽  
J. Mygind ◽  
O. H. Soerensen ◽  
B. Dueholm
Keyword(s):  
Transition Temperature ◽  
Tunnel Junction ◽  
Josephson Tunnel ◽  
Qualitative Determination
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