scholarly journals Coulomb Fission in Multiply-Charged Ammonia Clusters: Accurate Measurements of the Rayleigh Instability Limit from Fragmentation Patterns

2018 ◽  
Vol 122 (10) ◽  
pp. 2634-2644 ◽  
Author(s):  
Christopher Harris ◽  
Anthony J. Stace
Keyword(s):  
Rayleigh Instability ◽  
Multiply Charged ◽  
Coulomb Fission ◽  
Fragmentation Patterns ◽  
Ammonia Clusters

scholarly journals Coulomb fission in multiply charged molecular clusters: Experiment and theory

2017 ◽  
Vol 146 (16) ◽  
pp. 164302 ◽  
Author(s):  
Christopher Harris ◽  
Joshua Baptiste ◽  
Eric B. Lindgren ◽  
Elena Besley ◽  
Anthony J. Stace
Keyword(s):  
Molecular Clusters ◽  
Multiply Charged ◽  
Coulomb Fission

Decomposition Channels for Multiply Charged Ammonia Clusters

1986 ◽  
pp. 219-222
Author(s):  
D. Kreisle ◽  
K. Leiter ◽  
O. Echt ◽  
T. D. Märk
Keyword(s):  
Multiply Charged ◽  
Ammonia Clusters

Decomposition channels for multiply charged ammonia clusters

1986 ◽  
Vol 3 (2-3) ◽  
pp. 319-322 ◽  
Author(s):  
D. Kreisle ◽  
K. Leiter ◽  
O. Echt ◽  
T. D. M�rk
Keyword(s):  
Multiply Charged ◽  
Ammonia Clusters

In situ TEM Studies of agglomeration of sub-nanometer Ru layers in Ru/C multilayers

1992 ◽  
Vol 50 (1) ◽  
pp. 256-257
Author(s):  
Tai D. Nguyen ◽  
Ronald Gronsky ◽  
Jeffrey B. Kortright
Keyword(s):  
Layered Structure ◽  
Driving Force ◽  
High Energy ◽  
Superior Performance ◽  
In Situ Tem ◽  
Rayleigh Instability ◽  
Practical Applications ◽  
Transmission Electron ◽  
Diffraction Patterns

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.

A SYSTEMATIC STUDY OF 2s2 2pk - 2s2pk+l - 2pk+2 TRANSITIONS IN MULTIPLY-CHARGED Cl IONS.

1979 ◽  
Vol 40 (C1) ◽  
pp. C1-208-C1-210 ◽  
Author(s):  
J. P. Forester ◽  
D. J. Pegg ◽  
P. M. Griffin ◽  
G. D. Alton ◽  
S. B. Elston ◽  
...  
Keyword(s):  
Systematic Study ◽  
Multiply Charged
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