High-Resolution Electron Microscopy Analysis of Malaria Hemozoin Crystals Reveals New Aspects of Crystal Growth and Elemental Composition

2021 ◽  
Author(s):  
Camila Wendt ◽  
Wanderley de Souza ◽  
Alessandro Pinheiro ◽  
Leandro Silva ◽  
Ana Acácia de Sá Pinheiro ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Crystal Growth ◽  
High Resolution ◽  
Elemental Composition ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

High-resolution electron-microscopy analysis of splitting patterns in Ni alloys

2005 ◽  
Vol 85 (2) ◽  
pp. 51-59 ◽  
Author(s):  
H. A. Calderon * ◽  
G. Kostorz ◽  
L. Calzado-Lopez ◽  
C. Kisielowski ◽  
T. Mori
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Ni Alloys ◽  
Resolution Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

scholarly journals High Resolution Electron Microscopy Analysis of the Helicobacter pylori Cag Type IV Secretion System

2013 ◽  
Vol 19 (S2) ◽  
pp. 224-225
Author(s):  
J.A. Gaddy ◽  
T.L. Cover
Keyword(s):  
Electron Microscopy ◽  
Helicobacter Pylori ◽  
High Resolution Electron Microscopy ◽  
Secretion System ◽  
Type Iv Secretion ◽  
Type Iv Secretion System ◽  
Type Iv ◽  
Resolution Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Direct Correlation of Transport Properties and Microstructure In Y1Ba2Cu3O7-x Thin Film Grain Boundaries

1994 ◽  
Vol 357 ◽  
Author(s):  
B. V. Vuchic ◽  
K. L. Merkle ◽  
D. B. Buchholz ◽  
R. P. H. Chang ◽  
L. D. Marks
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Current Voltage ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis ◽  
The Individual

AbstractIndividual 45° [001] tilt grain boundaries in Y1Ba2Cu3O7-x thin films grown on biepitaxial substrates were studied. The thin films were grown using both pulsed organometallic beam epitaxy (POMBE) and laser ablation. Transport characteristics of the individual grain boundaries were measured including resistance - temperature (R-T) and current - voltage (I-V) dependencies with and without an applied magnetic field. In order to elucidate possible structural origins of the differences in transport behavior, the same grain boundaries which were electrically characterized were subsequently thinned for electron-microscopy analysis. Transmission-electron-microscopy and high-resolution-electron-microscopy were used to structurally characterize the grain boundaries. The macroscopic and microscopic structures of two boundaries, a nominally resistive and a superconducting grain boundary, are compared.

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