Multielement Analysis of Graphite and Silicon Carbide by Inductively Coupled Plasma Atomic Emission Spectrometry Using Solid Sampling and Electrothermal Vaporization

1999 ◽  
Vol 71 (4) ◽  
pp. 849-854 ◽  
Author(s):  
Uwe Schäffer ◽  
Viliam Krivan
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