Infrared Reflectance−Absorbance Spectroscopy of Thin Films Formed by Forced Dewetting of Solid−Fluid Interfaces

2008 ◽  
Vol 80 (21) ◽  
pp. 8012-8019 ◽  
Author(s):  
Shinobu Tsuruta Heier ◽  
Kevin E. Johnson ◽  
Anoma Mudalige ◽  
Domenic J. Tiani ◽  
Vanessa R. Reid ◽  
...  
Keyword(s):  
Thin Films ◽  
Fluid Interfaces ◽  
Infrared Reflectance ◽  
Absorbance Spectroscopy ◽  
Forced Dewetting

CONDUCTIVE COPPER SULFIDE THIN FILMS ON POLYIMIDE FOILS FOR OPTICAL AND OPTOELECTRONIC APPLICATIONS

2001 ◽  
Vol 15 (17n19) ◽  
pp. 774-777 ◽  
Author(s):  
J. CARDOSO ◽  
O. GOMEZ-DAZA ◽  
L. IXTLILCO ◽  
M. T. S. NAIR ◽  
P. K. NAIR
Keyword(s):  
Thin Films ◽  
Sheet Resistance ◽  
Copper Sulfide ◽  
Optoelectronic Device ◽  
Infrared Reflectance ◽  
Thermally Stable ◽  
Conductive Coatings ◽  
Device Structures ◽  
Conductive Substrates ◽  
Optoelectronic Applications

Copper sulfide thin films of 75 nm and 100 nm thickness were coated on Kapton foils (PI) of 25 nm thickness by floating them on a chemical bath. The foils were annealed at 150°C-400°C in N 2 converting the coating from CuS to Cu 1.8 S . The sheet resistance of the annealed coatings (100 nm) is 10-50 ohms/square which is almost unaltered after immersion in dilute HCl for 30-120 min. The infrared reflectance predicted for the coatings is 67%-77% at a wavelength 2.5 μm, which is nearly what is experimentally observed. The coated PI has a transmittance (25-35%) peak located around 550-600 nm. These thermally stable conductive coatings on PI foils might be used as conductive substrates for optoelectronic device structures.

Thickness, Composition, and Molecular Structure of Residual Thin Films Formed by Forced Dewetting of Ag from Glycerol/D2O Solutions

Langmuir ◽  
2014 ◽  
Vol 30 (50) ◽  
pp. 15181-15192 ◽  
Author(s):  
Jeanne E. Pemberton ◽  
Anoma Mudalige ◽  
Heemin Yoo
Keyword(s):  
Molecular Structure ◽  
Thin Films ◽  
Forced Dewetting

scholarly journals Hierarchical transitions and fractal wrinkling drive bacterial pellicle morphogenesis

2021 ◽  
Vol 118 (20) ◽  
pp. e2023504118
Author(s):  
Boyang Qin ◽  
Chenyi Fei ◽  
Bruce Wang ◽  
Howard A. Stone ◽  
Ned S. Wingreen ◽  
...  
Keyword(s):  
Thin Films ◽  
Model Organism ◽  
Seeding Density ◽  
Fluid Interfaces ◽  
Bacterial Cells ◽  
Group Level ◽  
Mechanical Theory ◽  
Pellicle Formation ◽  
Stereo Microscope ◽  
Film Microstructure

Bacterial cells can self-organize into structured communities at fluid–fluid interfaces. These soft, living materials composed of cells and extracellular matrix are called pellicles. Cells residing in pellicles garner group-level survival advantages such as increased antibiotic resistance. The dynamics of pellicle formation and, more generally, how complex morphologies arise from active biomaterials confined at interfaces are not well understood. Here, using Vibrio cholerae as our model organism, a custom-built adaptive stereo microscope, fluorescence imaging, mechanical theory, and simulations, we report a fractal wrinkling morphogenesis program that differs radically from the well-known coalescence of wrinkles into folds that occurs in passive thin films at fluid–fluid interfaces. Four stages occur: growth of founding colonies, onset of primary wrinkles, development of secondary curved ridge instabilities, and finally the emergence of a cascade of finer structures with fractal-like scaling in wavelength. The time evolution of pellicle formation depends on the initial heterogeneity of the film microstructure. Changing the starting bacterial seeding density produces three variations in the sequence of morphogenic stages, which we term the bypass, crystalline, and incomplete modes. Despite these global architectural transitions, individual microcolonies remain spatially segregated, and thus, the community maintains spatial and genetic heterogeneity. Our results suggest that the memory of the original microstructure is critical in setting the morphogenic dynamics of a pellicle as an active biomaterial.

Far-Infrared Reflectance and Transmittance Studies of YBa2Cu3O7-xSingle-Crystal Thin Films

2001 ◽  
Vol 40 (Part 1, No. 5A) ◽  
pp. 3163-3170 ◽  
Author(s):  
Hajime Shibata ◽  
Shinji Kimura ◽  
Satoshi Kashiwaya ◽  
Shigehiro Ueno ◽  
Masao Koyanagi ◽  
...  
Keyword(s):  
Thin Films ◽  
Far Infrared ◽  
Infrared Reflectance

Infrared reflectance characterization of porous GaN thin films on sapphire substrate using factorized-Rayleigh model

2019 ◽  
Vol 96 ◽  
pp. 109320 ◽  
Author(s):  
P. Yew ◽  
S.C. Lee ◽  
S.F. Cheah ◽  
S.S. Ng ◽  
H. Abu Hassan
Keyword(s):  
Thin Films ◽  
Sapphire Substrate ◽  
Infrared Reflectance

Observation of ultrafast amorphization dynamics in GeCu2Te3 thin films using echelon-based single-shot transient absorbance spectroscopy

2021 ◽  
Vol 119 (6) ◽  
pp. 061102
Author(s):  
Yusuke Arashida ◽  
Takayuki Suzuki ◽  
Shuhei Nara ◽  
Ikufumi Katayama ◽  
Yasuo Minami ◽  
...  
Keyword(s):  
Thin Films ◽  
Single Shot ◽  
Absorbance Spectroscopy ◽  
Transient Absorbance
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