Analytical applications of x-ray excited optical fluorescence spectra. Direct determination of fractional parts per million amounts of rare earths in thorium

1970 ◽  
Vol 42 (3) ◽  
pp. 325-329 ◽  
Author(s):  
T. R. Saranathan ◽  
V. A. Fassel ◽  
E. L. DeKalb
Keyword(s):  
Rare Earths ◽  
Fluorescence Spectra ◽  
Direct Determination ◽  
X Ray ◽  
Analytical Applications ◽  
Optical Fluorescence

Determination of trace rare earths by X-ray excited optical fluorescence

1968 ◽  
Vol 23 (11) ◽  
pp. 751-763 ◽  
Author(s):  
R.J. Jaworowski ◽  
J.F. Cosgrove ◽  
D.J. Bracco ◽  
R.M. Walters
Keyword(s):  
Rare Earths ◽  
X Ray ◽  
Optical Fluorescence

scholarly journals Analytical Applications of X-ray Excited Optical Fluorescence Spectra

1969 ◽  
Vol 18 (4) ◽  
pp. 210-217 ◽  
Author(s):  
Tokunosuke NAKAJIMA ◽  
Hiroshi KAWAGUCHI ◽  
Kyoichiro TAKASHIMA ◽  
Yoshihiko OUCHI
Keyword(s):  
Fluorescence Spectra ◽  
X Ray ◽  
Analytical Applications ◽  
Optical Fluorescence

Analytical applications of x-ray excited optical fluorescence spectra. Internal standard principle

1968 ◽  
Vol 40 (14) ◽  
pp. 2082-2084 ◽  
Author(s):  
Edward L. DeKalb ◽  
Velmer A. Fassel ◽  
Takeshi. Taniguchi ◽  
T. R. Saranathan
Keyword(s):  
Fluorescence Spectra ◽  
Internal Standard ◽  
X Ray ◽  
Analytical Applications ◽  
Optical Fluorescence

Direct determination of the wave field of an x-ray nanobeam

2008 ◽  
Vol 77 (1) ◽  
Author(s):  
Hidekazu Mimura ◽  
Hirokatsu Yumoto ◽  
Satoshi Matsuyama ◽  
Soichiro Handa ◽  
Takashi Kimura ◽  
...  
Keyword(s):  
Wave Field ◽  
Direct Determination ◽  
X Ray

Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method

1987 ◽  
Vol 26 (Part 1, No. 1) ◽  
pp. 157-161 ◽  
Author(s):  
Osamu Nittono ◽  
Yoshihiro Sadamoto ◽  
Sheng Kai Gong
Keyword(s):  
Direct Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputtered Films ◽  
Stress Levels
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