Short-time, spatially-resolved radiation processes in a high-voltage spark discharge

1970 ◽  
Vol 42 (1) ◽  
pp. 61-84 ◽  
Author(s):  
R. D. Sacks ◽  
John P. Walters
Keyword(s):  
High Voltage ◽  
Spark Discharge ◽  
Spatially Resolved ◽  
Radiation Processes ◽  
Short Time

THE EMISSION OF IONIZING RADIATION DURING A SPARK DISCHARGE

1957 ◽  
Vol 35 (3) ◽  
pp. 324-331 ◽  
Author(s):  
W. A. Prowse ◽  
G. R. Bainbridge
Keyword(s):  
Ionizing Radiation ◽  
High Voltage ◽  
Voltage Pulse ◽  
High Voltage Pulse ◽  
Spark Discharge ◽  
The Other ◽  
Time Interval ◽  
Delay Lines

A high voltage pulse lasting 0.35 microsecond is applied to a pair of delay lines, so that two pulses can be picked up from adjustable points of connection on the lines. One is applied to an irradiating gap and the other to a longer test gap, the gaps being so arranged that only mid-gap irradiation occurs. The sparking probability, P, of the test gap is used to indicate the presence of ionizing radiation. Variations of P with the time interval between the two pulses are recorded. They indicate that ionizing radiation is emitted in repeated short flashes. Photographic observations support this view.

Effect of Addition of Hydrogen to the Argon Sheath of a Unidirectional, High-Voltage Spark

1993 ◽  
Vol 47 (3) ◽  
pp. 309-316 ◽  
Author(s):  
Jennifer B. Cappel ◽  
Alexander Scheeline ◽  
Joel M. Goldberg
Keyword(s):  
Surface Chemistry ◽  
High Voltage ◽  
Electrode Surface ◽  
Copper Alloys ◽  
Plasma Chemistry ◽  
Spark Discharge ◽  
Hydrogen Addition ◽  
Ionization Limit

Changes in the spectrum of copper alloys excited with a unidirectional spark discharge in argon are noted when hydrogen is added to the system. Systematic enhancement in erosion of copper, but not of copper in brass or in Muntz metal, is observed. Argon spectra are also perturbed, with some cascades originating near the Ar I ionization limit enhanced while other, nearly isoenergetic, cascades terminating in the Ar I metastable levels are suppressed. Ar II emission is also enhanced in the presence of H2. Both electrode surface chemistry and plasma chemistry are affected by the hydrogen addition.

Particulates formed by a stabilized high voltage spark discharge

1981 ◽  
Vol 36 (4) ◽  
pp. 373-383 ◽  
Author(s):  
Alexander Scheeline ◽  
John A. Norris ◽  
J.C. Travis ◽  
J.R. Devoe ◽  
John P. Walters
Keyword(s):  
High Voltage ◽  
Spark Discharge

Discovery of an electrical post-pulse in the surroundings of a high voltage spark discharge

1981 ◽  
Vol 36 (3) ◽  
pp. 153-161 ◽  
Author(s):  
Alexander Scheeline ◽  
J.C. Travis ◽  
J.R. DeVoe ◽  
John P. Walters
Keyword(s):  
High Voltage ◽  
Spark Discharge

scholarly journals Coherence and time-frequency analysis of impulse voltage and current measurements

2017 ◽  
Vol 26 (2) ◽  
pp. 118
Author(s):  
Jelena Dikun ◽  
Emel Onal
Keyword(s):  
Frequency Analysis ◽  
High Voltage ◽  
Electromagnetic Interference ◽  
Digital Processing ◽  
Noise Sources ◽  
Time Frequency Analysis ◽  
Time Frequency ◽  
Interference Level ◽  
Impulse Voltage ◽  
Short Time

The aim of this paper is to point out the advantages of the use of the time-frequency analysis in the digital processing of waveforms recorded in high voltage impulse tests. Impulse voltage tests are essential to inspect and test insulation integrity of high voltage apparatus. On the other hand, generated impulse currents are used for different test applications such as investigation of high current effects, electromagnetic interference (EMI) testing, etc. Obtained voltage and current waveforms usually have some sort of interferences originated from the different sources. These interferences have to be removed from the original impulse data in order to evaluate the waveform characteristics precisely. When the interference level is high enough, it might not be possible to distinguish signal parameters from the recorded data. Conventional filtering methods cannot be useful for some interference like white noise. In that case, time-frequency filtering methods might be necessary. In this study, the wavelet analysis, which is a powerful time-frequency signal processing tool, is used to recognize the noise of impulse current and voltage data. Thus, the noise sources can be determined by short time Fourier Transform, and a coherence approach is used to determine the bandwidth of noises.

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