Quantitative Determination of Low Atomic Number Elements Using Intensity Ratio of Coherent to Incoherent Scattering of X-Rays. Determination of Hydrogen and Carbon

1961 ◽  
Vol 33 (1) ◽  
pp. 67-70 ◽  
Author(s):  
C. W. Dwiggins
Keyword(s):  
Quantitative Determination ◽  
Atomic Number ◽  
Intensity Ratio ◽  
Incoherent Scattering ◽  
X Rays

Quantitative Determination of Carbon in Solid Hydrocarbons Using the Intensity Ratio of Incoherent to Coherent Scattering of X-Rays

1964 ◽  
Vol 18 (6) ◽  
pp. 171-174 ◽  
Author(s):  
C. J. Toussaint ◽  
G. Vos
Keyword(s):  
Intensity Ratio ◽  
Coherent Scattering ◽  
X Rays ◽  
Ray Method ◽  
Sample Weight ◽  
X Ray ◽  
Carbon Determination ◽  
Solid Hydrocarbons ◽  
Good Agreement

A method is presented for the determination of carbon in solid hydrocarbons using the intensity ratio of incoherent to coherent scattering of x-rays. The method is very rapid with precision at the 95% confidence level of about ±0.3%. The minimum sample weight necessary is 0 2 g. Analysis of samples by the x-ray method shows good agreement with values obtained by microcombustion. Finally a general comparison between different methods for carbon determination in solid hydrocarbons is discussed.

scholarly journals Quantitative analysis by energy dispersive X-ray fluorescence by the transmission method applied to geological samples

1994 ◽  
Vol 51 (2) ◽  
pp. 197-206 ◽  
Author(s):  
S.M. Simabuco ◽  
V.F. Nascimento Filho
Keyword(s):  
Atomic Number ◽  
Energy Dispersive ◽  
X Rays ◽  
Geological Samples ◽  
Transmission Method ◽  
Absorption Effect ◽  
X Ray ◽  
Fundamental Parameters ◽  
Absorption Correction

Three certified samples of different matrices (Soil-5, SL-1/IAEA and SARM-4/SABS) were quantitatively analysed by energy dispersive X-ray fluorescence with radioisotopic excitation. The observed errors were about 10-20% for the majority of the elements and less than 10% for Fe and Zn in the Soil-5, Mn in SL-1, and Ti, Fe and Zn in SARM-4 samples. Annular radioactive sources of Fe-55 and Cd-109 were utilized for the excitation of elements while a Si(Li) semiconductor detector coupled to a multichannel emulation card inserted in a microcomputer was used for the detection of the characteristic X-rays. The fundamental parameters method was used for the determination of elemental sensitivities and the irradiator or transmission method for the correction of the absorption effect of characteristic X-rays of elements on the range of atomic number 22 to 42 (Ti to Mo) and excitation with Cd-109. For elements in the range of atomic number 13 to 23 (Al to V) the irradiator method cannot be applied since samples are not transparent for the incident and emergent X-rays. In order to perform the absorption correction for this range of atomic number excited with Fe-55 source, another method was developed based on the experimental value of the absorption coefficients, associated with absorption edges of the elements.

scholarly journals Determination of carbon and hydrogen in hydrocarbon by the coherent to the incoherent scattering intensity ratio

1964 ◽  
Vol 13 (4) ◽  
pp. 319-324 ◽  
Author(s):  
Keishi HASEGAWA ◽  
Masao KAJIKAWA ◽  
Nobukazu OKAMOTO ◽  
Eiichi ASADA
Keyword(s):  
Intensity Ratio ◽  
Incoherent Scattering ◽  
Scattering Intensity

scholarly journals Effective Atomic Number Determination of Rare Earth Oxides with Scattering Intensity Ratio

2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
A. Turşucu ◽  
D. Demir ◽  
P. Önder
Keyword(s):  
Rare Earth ◽  
Atomic Number ◽  
Intensity Ratio ◽  
Theoretical Calculations ◽  
Effective Atomic Number ◽  
Incident Beam ◽  
Rare Earth Oxide ◽  
Scattering Intensity ◽  
Effective Atomic Numbers

Effective atomic numbers () of scientific samples (rare earth) were determined experimentally by scattering of 59.54 keV gamma photons from 5 Ci241Am annular radioactive source. The scattered gamma photons were collected by using a high-resolution HPGe semiconductor detector placed at to the incident beam. This experiment was carried out on several elements in the atomic range for 59.54 keV incident photons. Photopeak efficiency and air and sample absorption corrections were performed on Rayleigh to Compton scattering intensity ratio; then the ratio was plotted as a function of atomic number and a fit curve was constituted. The effective atomic numbers of rare earth oxide samples were determined by this fit curve. Also, related parameters were determined by absorption technique with the same incident photon energy. Obtained values from this fit curve were compared to theoretical values and were found to closely agree with theoretical calculations.

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

Problems in Thin-Film X-ray Quantification

1990 ◽  
Vol 48 (2) ◽  
pp. 458-459
Author(s):  
J N Chapman ◽  
W A P Nicholson
Keyword(s):  
Thin Film ◽  
Specimen Thickness ◽  
X Rays ◽  
Characteristic Peak ◽  
Local Composition ◽  
X Ray ◽  
Measured Ratio ◽  
Path Lengths ◽  
Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

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