Pipet Method of Sedimentation Analysis. Rapid Determination of Distribution of particle Size

1950 ◽  
Vol 22 (6) ◽  
pp. 840-841 ◽  
Author(s):  
V. V. Deshpande ◽  
M. S. Telang
1957 ◽  
Vol 24 (105) ◽  
pp. 147-150 ◽  
Author(s):  
Victor K. La Mer ◽  
Igor W. Plesner

1985 ◽  
Vol 21 (9) ◽  
pp. 489-492 ◽  
Author(s):  
Ya. V. Mirskii ◽  
T. S. Nesmeyanova ◽  
T. V. Goos ◽  
V. M. Kaviev ◽  
A. V. Klimov ◽  
...  

Author(s):  
Maame E. T. Croffie ◽  
Paul N. Williams ◽  
Owen Fenton ◽  
Anna Fenelon ◽  
Karen Daly

Abstract Purpose Information about particle size distribution (PSD) and soil texture is essential for understanding soil drainage, porosity, nutrient availability, and trafficability. The sieve-pipette/gravimetric method traditionally used for particle size analysis is labour-intensive and resource-intensive. X-ray fluorescence (XRF) spectrometry may provide a rapid alternative. The study’s aim was to examine the use of XRF for rapid determination of PSD in Irish soils. Methods Soils (n = 355) from existing archives in Ireland were analysed with a benchtop energy-dispersive XRF (EDXRF). Correlation and regression analyses were determined to compare Rb, Fe, Al, and Si concentrations to % clay, % silt, and % sand. Also, linear regression models were developed to compare % clay, % sand, and % silt measured by the gravimetric method to values predicted by EDXRF. Results The relationship between element concentration and PSD was dependent on parent material. Rb, Al, and Fe showed a significant (p < 0.05) correlation (r > 0.50) with % clay and % sand in soils derived from limestone and siliceous stone parent materials. Rb was the best predictor for % clay (R2 = 0.49, RMSE = 10.20) in soils derived from limestone and siliceous stone-derived soils. Conclusion Geochemistry and clay mineralogy of the soils’ parent material strongly influenced the EDXRF’s ability to predict particle size. The EDXRF could predict % clay in soils from parent materials which weather easily, but the opposite was true for soils with parent material recalcitrant to weathering. In conclusion, this study has shown that the EDXRF can screen % clay in soils derived from limestone and siliceous stone parent materials.


Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

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