scholarly journals Principal Component Analysis (PCA)-Assisted Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): A Versatile Method for the Investigation of Self-Assembled Monolayers and Multilayers as Precursors for the Bottom-Up Approach of Nanoscaled Devices

2014 ◽  
Vol 86 (12) ◽  
pp. 5740-5748 ◽  
Author(s):  
Markus Holzweber ◽  
Thomas Heinrich ◽  
Valentin Kunz ◽  
Sebastian Richter ◽  
Christoph H.-H. Traulsen ◽  
...  
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