Iron Speciation of Airborne Subway Particles by the Combined Use of Energy Dispersive Electron Probe X-ray Microanalysis and Raman Microspectrometry

2013 ◽  
Vol 85 (21) ◽  
pp. 10424-10431 ◽  
Author(s):  
Hyo-Jin Eom ◽  
Hae-Jin Jung ◽  
Sophie Sobanska ◽  
Sang-Gwi Chung ◽  
Youn-Suk Son ◽  
...  
Keyword(s):  
Electron Probe ◽  
Energy Dispersive ◽  
Iron Speciation ◽  
X Ray ◽  
Combined Use ◽  
Raman Microspectrometry

Investigation of the Chemical Mixing State of Individual Asian Dust Particles by the Combined Use of Electron Probe X-ray Microanalysis and Raman Microspectrometry

2012 ◽  
Vol 84 (7) ◽  
pp. 3145-3154 ◽  
Author(s):  
Sophie Sobanska ◽  
HeeJin Hwang ◽  
Marie Choël ◽  
Hae-Jin Jung ◽  
Hyo-Jin Eom ◽  
...  
Keyword(s):  
Electron Probe ◽  
Asian Dust ◽  
Dust Particles ◽  
Mixing State ◽  
X Ray ◽  
Combined Use ◽  
Chemical Mixing ◽  
Raman Microspectrometry

A note on the occurrence of chevkinite, allanite, and zirkelite on St. Kilda, Scotland

1982 ◽  
Vol 46 (341) ◽  
pp. 445-448 ◽  
Author(s):  
R. R. Harding ◽  
R. J. Merriman ◽  
P. H. A. Nancarrow
Keyword(s):  
Rare Earth ◽  
Great Britain ◽  
Electron Probe ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
Electron Probe Analysis ◽  
Accessory Minerals ◽  
X Ray ◽  
Probe Analysis ◽  
Recorded Occurrence

AbstractThe occurrence of three accessory minerals with significant rare earth contents in Tertiary acid rocks of St. Kilda is described. Allanite, zirkelite, and chevkinite were identified by electron probe analysis (with energy-dispersive attachment) and the chevkinite confirmed by X-ray diffraction. Brief comparison is made with other Tertiary occurrences of RE minerals. This is the first recorded occurrence of chevkinite in Great Britain.

The Determination of the Efficiency of Energy Dispersive X-Ray Spectrometers by a New Reference Material

2006 ◽  
Vol 12 (5) ◽  
pp. 406-415 ◽  
Author(s):  
Marco Alvisi ◽  
Markus Blome ◽  
Michael Griepentrog ◽  
Vasile-Dan Hodoroaba ◽  
Peter Karduck ◽  
...  
Keyword(s):  
Reference Material ◽  
Electron Probe ◽  
Detection Efficiency ◽  
Calibration Procedure ◽  
Energy Dispersive ◽  
X Ray ◽  
Line Intensities ◽  
Operator Assistance ◽  
Scanning Electron

A calibration procedure for the detection efficiency of energy dispersive X-ray spectrometers (EDS) used in combination with scanning electron microscopy (SEM) for standardless electron probe microanalysis (EPMA) is presented. The procedure is based on the comparison of X-ray spectra from a reference material (RM) measured with the EDS to be calibrated and a reference EDS. The RM is certified by the line intensities in the X-ray spectrum recorded with a reference EDS and by its composition. The calibration of the reference EDS is performed using synchrotron radiation at the radiometry laboratory of the Physikalisch-Technische Bundesanstalt. Measurement of RM spectra and comparison of the specified line intensities enables a rapid efficiency calibration on most SEMs. The article reports on studies to prepare such a RM and on EDS calibration and proposes a methodology that could be implemented in current spectrometer software to enable the calibration with a minimum of operator assistance.

Electron probe x-ray microanalysis with energy-dispersive x-ray spectrometry: The basics of x-ray spectrum interpretation

1994 ◽  
Vol 52 ◽  
pp. 376-377
Author(s):  
Dale E. Newbury
Keyword(s):  
Atomic Number ◽  
Electron Probe ◽  
Energy Dispersive ◽  
X Ray ◽  
Linear Dimensions ◽  
Specimen Volume ◽  
Spectrum Interpretation ◽  
The Rich ◽  
Source Of Information ◽  
Basic Level

Electron probe x-ray microanalysis (EPMA) with energy dispersive x-ray spectrometry (EDS) provides the capability for detecting elements with atomic number ≥ 4 (beryllium) from an excited specimen volume with linear dimensions of micrometers and a mass in the picogram range. To maximize the utility of EPMA/EDS, the analyst needs to understand the rich source of information that is potentially available in the x-ray spectrum. At its most basic level, interpretation of the spectrum consists of recognizing and identifying the various components of the spectrum as recorded by the EDS system: characteristic peaks, artifacts, and continuum background. While a modern EDS system is capable of making this interpretation in an automatic fashion, the careful analyst will always check the computer’s interpretation, which of course demands that the analyst be at least as "smart" as the computer! A systematic examination of spectra from pure elements or simple compounds is a good way to develop the necessary working knowledge.

Use of the Soft X-Ray Spectrograph and the Electron-Probe Microanalyzer for Determination of Elements Carbon Through Iron in Minerals and Rocks

1965 ◽  
Vol 9 ◽  
pp. 487-503
Author(s):  
A. K. Baird ◽  
D. H. Zenger
Keyword(s):  
High Precision ◽  
Electron Probe ◽  
Bulk Composition ◽  
Major Elements ◽  
Major Constituent ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Minor Elements ◽  
Combined Use ◽  
Sodium Magnesium

AbstractThe major elements m common rocks are of low atomic number, but analyses of high precision are possible by soft X-ray spectrography if several grams of rock sample are available. The electron-probe microanalyzer is shown to complement this established method by permitting analyses of particles as small as 1 μ in diameter. This paper describes applications of these methods to the analysis of the major and minor elements of silicate, carbonate, and phosphate minerals and rocks.Elements of particular interest are as follows : carbon in particles enclosed in carbonate rocks; oxygen, as the major constituent of the specimens; phosphorus in phosphatic nodules and apatites; manganese and iron, as colorations in fossil shells; and the group oxygen, sodium, magnesium, aluminum, silicon, potassium, calcium, and iron as complex segregations and zonations within single crystals of several mineral phases.If the bulk composition of a rock is known, and also the chemistry of the constituent minerals, it is possible to compute quantitative minéralogie analyses of high precision. Thus, the combined use of soft X-ray spectrography and electronprobe microanalysis can provide quantitative chemical and mineralogicat information on the earth's crust on all scales from thousands of square miles (by means of appropriate sampling) down to the scale of 1 μ.

Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)

2008 ◽  
Vol 14 (S2) ◽  
pp. 1152-1153
Author(s):  
K Keil ◽  
R Fitzgerald ◽  
KFJ Heinrich
Keyword(s):  
New Mexico ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Energy Dispersive ◽  
X Ray

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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