Membrane Response Model for Ion-Selective Electrodes Operated by Controlled-Potential Thin-Layer Coulometry

2011 ◽  
Vol 83 (2) ◽  
pp. 486-493 ◽  
Author(s):  
Eric Bakker
Keyword(s):  
Thin Layer ◽  
Ion Selective Electrodes ◽  
Response Model ◽  
Controlled Potential

Thin Layer Electrochemical Studies Using Controlled Potential or Controlled Current.

1965 ◽  
Vol 37 (11) ◽  
pp. 1312-1316 ◽  
Author(s):  
D. M. Oglesby ◽  
S. H. Omang ◽  
C. N. Reilley
Keyword(s):  
Thin Layer ◽  
Electrochemical Studies ◽  
Controlled Potential

scholarly journals Anomalous potentiometric response of solid-contact ion-selective electrodes with thin-layer membranes

2022 ◽  
pp. 131416
Author(s):  
Tingting Han ◽  
Andrey V. Kalinichev ◽  
Zekra Mousavi ◽  
Konstantin N. Mikhelson ◽  
Johan Bobacka
Keyword(s):  
Thin Layer ◽  
Ion Selective Electrodes ◽  
Solid Contact ◽  
Potentiometric Response

Simplified Nitrate-Reductase-Based Nitrate Detection by a Hybrid Thin-Layer Controlled Potential Coulometry/Spectroscopy Technique

2013 ◽  
Vol 85 (20) ◽  
pp. 9486-9492 ◽  
Author(s):  
Tingting Wang ◽  
Kevin T. Schlueter ◽  
Bill L. Riehl ◽  
Jay M. Johnson ◽  
William R. Heineman
Keyword(s):  
Nitrate Reductase ◽  
Thin Layer ◽  
Spectroscopy Technique ◽  
Controlled Potential ◽  
Controlled Potential Coulometry

Applications of Photoelectron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 506-507
Author(s):  
William J. Baxter
Keyword(s):  
Electron Microscopy ◽  
Thermal Decomposition ◽  
Chemical Composition ◽  
Ultraviolet Radiation ◽  
Thin Layer ◽  
Edge Effects ◽  
Electron Optics ◽  
Surface Layers ◽  
Crystalline Orientation ◽  
Fluorescent Screen

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.

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