Compact Ultrafast Orthogonal Acceleration Time-of-Flight Mass Spectrometer for On-Line Gas Analysis by Electron Impact Ionization and Soft Single Photon Ionization Using an Electron Beam Pumped Rare Gas Excimer Lamp as VUV-Light Source

2007 ◽  
Vol 79 (21) ◽  
pp. 8118-8124 ◽  
Author(s):  
F. Mühlberger ◽  
M. Saraji-Bozorgzad ◽  
M. Gonin ◽  
K. Fuhrer ◽  
R. Zimmermann
2012 ◽  
Vol 271-272 ◽  
pp. 112-115
Author(s):  
A Dan Li ◽  
Min Zi Chen ◽  
Wen Feng Guo ◽  
Ralf Zimmermann

An electron beam pumped rare gas excimer lamp (EBEL) was utilized to emit the intensive vacuum ultraviolet (VUV) radiation at 126 nm for soft single photon ionization (SPI) of polycyclic aromatic hydrocarbons (PAHs) in a soil sample. The VUV light source was coupled to a compact and mobile time-of-flight mass spectrometer (TOFMS) for the on-line measurement of PAHs. The moderate desorption temperature was set at 300 °C to guarantee the rapid evaporation of the PAHs in the soil sample and without decomposition from the larger molecules. With the thermal treatment, sample extraction and cleanup steps were not needed. The system developed herein was found to perform sufficiently well to evaluate the PAHs in the environmental soil sample at ppm level.


1978 ◽  
Vol 33 (9) ◽  
pp. 1111-1113 ◽  
Author(s):  
F. Egger ◽  
T. D. Mark

Electron impact ionization of He, Ne, Ar, Kr and Xe has been studied with a double focussing mass spectrometer Varian MAT CH5. Ratios of various multiple ionization cross sections with respect to single ionization cross sections for He, Ne, Ar, Kr and Xe at electron energies of 50, 100 and 150eV are given. These cross section ratios are com­pared with previous determinations.


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