Phase Change Microvalve for Integrated Devices

2004 ◽  
Vol 76 (13) ◽  
pp. 3740-3748 ◽  
Author(s):  
Rohit Pal ◽  
Ming Yang ◽  
Brian N. Johnson ◽  
David T. Burke ◽  
Mark A. Burns
Keyword(s):  
Phase Change ◽  
Integrated Devices

Imaging nanostructures on ablated kapton polymide

1993 ◽  
Vol 51 ◽  
pp. 872-873
Author(s):  
Daniel L. Callahan ◽  
H. M. Phillips ◽  
R. Sauerbrey
Keyword(s):  
Electron Microscopy ◽  
Polymer Surface ◽  
Grating Period ◽  
Laser Wavelength ◽  
Integrated Devices ◽  
Transmission Electron ◽  
Excimer Laser Irradiation ◽  
Produce Line ◽  
Line Patterns ◽  
Anisotropic Conduction

Excimer laser irradiation has been used to interferometrically ablate submicron line patterns on to Kapton polyimide. Such patterned material may exhibit highly anisotropic conduction as was predicted from previous studies showing enhanced conductivity from uniformly ablated material. We are currently exploiting this phenomenon to create integrated devices using conventional polymers as both dielectrics and conductors. Extensive scanning electron microscopy (SEM) and limited transmission electron microscopy (TEM) have been conducted in order to characterize the morphology of such patterned nanostructures as a function of processing conditions.The ablation technique employed produces an interference pattern on the polymer surface of period equal to half that of a diffraction grating period, independent of the laser wavelength. In these experiments, a 328 nm grating has been used to produce line patterns of 164 nm line-spacings as shown in Figures 1 and 2. A 200 Å Au coating has been used to both prevent charging and, perhaps more importantly, enhance contrast.

The effect of an aluminum heat-sink layer on the laser-induced amorphization of SiOx/TeGeSn/SiOx phase-change recording films

1989 ◽  
Vol 47 ◽  
pp. 574-575
Author(s):  
Matthew R. Libera ◽  
Martin Chen
Keyword(s):  
Thin Film ◽  
Phase Change ◽  
Heat Sink ◽  
Multilayer Film ◽  
Glassy Phase ◽  
Film Structure ◽  
Glass Forming ◽  
Active Storage ◽  
Dielectric Layers ◽  
Amorphous States

Phase-change erasable optical storage is based on the ability to switch a micron-sized region of a thin film between the crystalline and amorphous states using a diffraction-limited laser as a heat source. A bit of information can be represented as an amorphous spot on a crystalline background, and the two states can be optically identified by their different reflectivities. In a typical multilayer thin-film structure the active (storage) layer is sandwiched between one or more dielectric layers. The dielectric layers provide physical containment and act as a heat sink. A viable phase-change medium must be able to quench to the glassy phase after melting, and this requires proper tailoring of the thermal properties of the multilayer film. The present research studies one particular multilayer structure and shows the effect of an additional aluminum layer on the glass-forming ability.

Crystallization fractionation technology for paraffin-based phase change materials production

2020 ◽  
pp. 33-38
Author(s):  
S.S. Kruglov (Jr.) ◽  
◽  
G.L. Patashnikov ◽  
S.S. Kruglov (Sr.) ◽  
◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Materials

NUMERICAL STUDY OF A SOLAR GREENHOUSE DRYER WITH A PHASE-CHANGE MATERIAL AS AN ENERGY STORAGE MEDIUM

2018 ◽  
Vol 49 (6) ◽  
pp. 509-528 ◽  
Author(s):  
Orawan Aumporn ◽  
Belkacem Zeghmati ◽  
Xavier Chesneau ◽  
Serm Janjai
Keyword(s):  
Energy Storage ◽  
Phase Change ◽  
Phase Change Material ◽  
Numerical Study ◽  
Storage Medium ◽  
Solar Greenhouse ◽  
Change Material
Sign in / Sign up

Export Citation Format

Share Document