Resonance and Nonresonant Laser Ionization of Sputtered Uranium Atoms from Thin Films and Single Microparticles:  Evaluation of a Combined System for Particle Trace Analysis

2003 ◽  
Vol 75 (13) ◽  
pp. 3175-3181 ◽  
Author(s):  
Nicole Erdmann ◽  
Maria Betti ◽  
Felix Kollmer ◽  
Alfred Benninghoven ◽  
Carsten Grüning ◽  
...  
Keyword(s):  
Thin Films ◽  
Trace Analysis ◽  
Laser Ionization ◽  
Combined System ◽  
Particle Trace

Microscale Thermal Energy Transfer Over a Combined System of Thin Films: Analytical Approach

2019 ◽  
Vol 48 (3) ◽  
pp. 89-108 ◽  
Author(s):  
Bekir Sami Yilbas ◽  
R.S.M. Alassar ◽  
Saad Bin Mansoor ◽  
Ahmad Y. Al-Dweik
Keyword(s):  
Thin Films ◽  
Energy Transfer ◽  
Thermal Energy ◽  
Analytical Approach ◽  
Combined System

scholarly journals Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

2018 ◽  
Vol 9 ◽  
pp. 686-692 ◽  
Author(s):  
Daiki Katsube ◽  
Hayato Yamashita ◽  
Satoshi Abo ◽  
Masayuki Abe
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Metal Oxide ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Film Surface ◽  
Laser Deposition ◽  
Combined System ◽  
Force Microscopy ◽  
Atomic Force

We have designed and developed a combined system of pulsed laser deposition (PLD) and non-contact atomic force microscopy (NC-AFM) for observations of insulator metal oxide surfaces. With this system, the long-period iterations of sputtering and annealing used in conventional methods for preparing a metal oxide film surface are not required. The performance of the combined system is demonstrated for the preparation and high-resolution NC-AFM imaging of atomically flat thin films of anatase TiO2(001) and LaAlO3(100).

Application of Dual Laser Ionization to Trace Analysis of Sodium in A Flame

1988 ◽  
Vol 35 (3) ◽  
pp. 179-185 ◽  
Author(s):  
King-Chuen Lin ◽  
Yin-Shing Duh ◽  
Ti-Ching Sheu ◽  
Tzu-Jeng Hsu
Keyword(s):  
Trace Analysis ◽  
Laser Ionization ◽  
Dual Laser

Photoelectrochemical Behaviors of Pt/TiO2 Nanocomposite thin films Electrodes Prepared by PLD/Sputtering Combined System

2004 ◽  
Vol 846 ◽  
Author(s):  
Takeshi Sasaki ◽  
William T. Nichols ◽  
Jong-Won Yoon ◽  
Naoto Koshizaki
Keyword(s):  
Thin Films ◽  
Wavelength Region ◽  
Pt Nanoparticles ◽  
Band Gap Energy ◽  
Nanocomposite Films ◽  
Combined System ◽  
Post Annealing ◽  
Nanocomposite Thin Films ◽  
New Energy ◽  
The Matrix

ABSTRACTSputtering of TiO2 and pulse laser deposition (PLD) of Pt were performed simultaneously to build the nanocomposite with homogenous dispersion of Pt in TiO2 matrix. The films exhibited a pronounced decrease in the optical band gap energy with increasing Pt content indicating the formation of new energy states in the optical gap of TiO2 matrix. As-deposited nanocomposite films were amorphous and crystallized to Pt metal and rutile type of TiO2 after post-annealing at 600 °C. Pt nanoparticle size in the annealed nanocomposite films increased from 6 to 9 nm with the repetition rate of the laser. The photoelectrochemical measurements of the Pt/TiO2 nanocomposite films in aqueous 0.1 M Na2SO4 solution indicate that a dramatic increase in anodic photocurrent at 1.0 V vs. Ag/AgCl at the wavelength region of visible light occurred in annealed films. Pt nanoparticles in the matrix of TiO2 can play an important role in the optical and photoelectrochemical proprieties of Pt/TiO2 nanocomposite thin films.

scholarly journals Ultra Trace Analysis of Organic Hazardous Compounds by Laser Ionization Mass Spectrometry

2006 ◽  
Vol 34 (4) ◽  
pp. 283-288 ◽  
Author(s):  
Shun-ichi HAYASHI ◽  
Tetsuya SUZUKI ◽  
Shun-ichi ISHIUCHI ◽  
Masaaki FUJII
Keyword(s):  
Mass Spectrometry ◽  
Trace Analysis ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Laser Ionization ◽  
Ultra Trace ◽  
Hazardous Compounds ◽  
Ultra Trace Analysis
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