Measurement of vanadium impurity in oxygen-implanted silicon by isotope dilution and resonance ionization mass spectrometry

1990 ◽  
Vol 62 (3) ◽  
pp. 240-244 ◽  
Author(s):  
Santos. Mayo ◽  
John D. Fassett ◽  
Howard M. Kingston ◽  
Richard J. Walker
2019 ◽  
Vol 107 (7) ◽  
pp. 645-652 ◽  
Author(s):  
Sebastian Raeder ◽  
Nina Kneip ◽  
Tobias Reich ◽  
Dominik Studer ◽  
Norbert Trautmann ◽  
...  

Abstract Resonance ionization mass spectrometry is an efficient tool to detect minute amounts of long-lived radio-isotopes in environmental samples. Applying resonant excitation and ionization with pulsed laser radiation within a hot cavity atomizer enables the sensitive detection and precise quantification of long-lived actinide isotopes. Due to the inherently element selective ionization process, this method ensures ultimate suppression of contaminations from other elements and molecules. The characterization of in-source resonance ionization of the actinide elements U, Th, Np, and Am using a compact quadrupole mass spectrometer (QMS) setup are discussed.


Sign in / Sign up

Export Citation Format

Share Document