Spectrometry of x-ray induced emission in sputtering deposition: a new technique for in situ thin-film chemical analysis

1987 ◽  
Vol 59 (3) ◽  
pp. 440-443 ◽  
Author(s):  
Michel. Hecq ◽  
Jacques. Leleux
Keyword(s):  
Thin Film ◽  
Chemical Analysis ◽  
New Technique ◽  
Sputtering Deposition ◽  
X Ray ◽  
A New Technique

scholarly journals In situ high-pressure and high-temperature X-ray microtomographic imaging during large deformation: A new technique for studying mechanical behavior of multiphase composites

Geosphere ◽  
2011 ◽  
Vol 7 (1) ◽  
pp. 40-53 ◽  
Author(s):  
Yanbin Wang ◽  
Charles Lesher ◽  
Guillaume Fiquet ◽  
Mark L. Rivers ◽  
Norimasa Nishiyama ◽  
...  
Keyword(s):  
High Pressure ◽  
High Temperature ◽  
Mechanical Behavior ◽  
Large Deformation ◽  
New Technique ◽  
X Ray ◽  
Multiphase Composites ◽  
A New Technique

scholarly journals Prealamethicin F50 and related peptaibols from Trichoderma arundinaceum: validation of their authenticity via in situ chemical analysis

RSC Advances ◽  
2017 ◽  
Vol 7 (72) ◽  
pp. 45733-45741 ◽  
Author(s):  
José Rivera-Chávez ◽  
Huzefa A. Raja ◽  
Tyler N. Graf ◽  
Jacklyn M. Gallagher ◽  
Prashant Metri ◽  
...  
Keyword(s):  
Secondary Metabolites ◽  
Chemical Analysis ◽  
New Technique ◽  
A New Technique

A new technique was used to monitor the chemistry of fungal cultures in situ, thereby confirming authenticity of secondary metabolites.

In situ simultaneous small and wide angle x-ray scattering: A new technique to study starch gelatinization

1994 ◽  
Vol 32 (8) ◽  
pp. 1579-1583 ◽  
Author(s):  
P. J. Jenkins ◽  
R. E. Comerson ◽  
A. M. Donald ◽  
W. Bras ◽  
G. E. Derbyshire ◽  
...  
Keyword(s):  
New Technique ◽  
Wide Angle ◽  
X Ray ◽  
Starch Gelatinization ◽  
X Ray Scattering ◽  
A New Technique ◽  
Ray Scattering

In situ chemical analysis in thin film production using soft x‐ray emission spectroscopy

1991 ◽  
Vol 9 (3) ◽  
pp. 638-645 ◽  
Author(s):  
M. Georgson ◽  
G. Bray ◽  
Y. Claesson ◽  
J. Nordgren ◽  
C.‐G. Ribbing ◽  
...  
Keyword(s):  
Thin Film ◽  
Chemical Analysis ◽  
Emission Spectroscopy ◽  
Film Production ◽  
X Ray ◽  
Thin Film Production

A new technique for measuring the polarization from celestial X-ray sources

1993 ◽  
Author(s):  
Robert Austin ◽  
Takahisa Minamitani ◽  
Brian Ramsey
Keyword(s):  
New Technique ◽  
X Ray ◽  
A New Technique
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