Characterization of thin-layer chromatographically separated fractions by Fourier transform infrared diffuse reflectance spectrometry

1987 ◽  
Vol 59 (3) ◽  
pp. 415-418 ◽  
Author(s):  
John M. Chalmers ◽  
Moray W. Mackenzie ◽  
John L. Sharp ◽  
Roger N. Ibbett
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