Use of spherical targets to minimize effects of neutron scattering by hydrogen in neutron capture prompt .gamma.-ray activation analysis

1992 ◽  
Vol 64 (20) ◽  
pp. 2366-2371 ◽  
Author(s):  
Elizabeth A. Mackey ◽  
Glen E. Gordon ◽  
Richard M. Lindstrom ◽  
David L. Anderson
Keyword(s):  
Activation Analysis ◽  
Neutron Scattering ◽  
Neutron Capture ◽  
Gamma Ray ◽  
Prompt Gamma

Effects of target shape and neutron scattering on element sensitivities for neutron-capture prompt .gamma.-ray activation analysis

1991 ◽  
Vol 63 (3) ◽  
pp. 288-292 ◽  
Author(s):  
Elizabeth A. Mackey ◽  
Glen E. Gordon ◽  
Richard M. Lindstrom ◽  
David L. Anderson
Keyword(s):  
Activation Analysis ◽  
Neutron Scattering ◽  
Neutron Capture ◽  
Gamma Ray ◽  
Prompt Gamma ◽  
Target Shape

Neutron-capture prompt .gamma.-ray activation analysis for multielement determination in complex samples

1979 ◽  
Vol 51 (13) ◽  
pp. 2209-2221 ◽  
Author(s):  
M. P. Failey ◽  
D. L. Anderson ◽  
W. H. Zoller ◽  
G. E. Gordon ◽  
R. M. Lindstrom
Keyword(s):  
Activation Analysis ◽  
Neutron Capture ◽  
Gamma Ray ◽  
Prompt Gamma ◽  
Complex Samples ◽  
Multielement Determination

Determination of Hydrogen in Semiconductors and Related Materials by Cold Neutron Capture Prompt Gamma-Ray Activation Analysis

1993 ◽  
Vol 324 ◽  
Author(s):  
Rick L. Paul ◽  
Richard M. Lindstrom
Keyword(s):  
Activation Analysis ◽  
Neutron Capture ◽  
Gamma Ray ◽  
Cold Neutron ◽  
Dielectric Film ◽  
Nondestructive Method ◽  
Chemical Form ◽  
Prompt Gamma ◽  
Γ Ray

AbstractA reliable nondestructive method for measuring trace amounts of hydrogen in semiconductors and related materials has long been needed. Cold neutron capture prompt γ-ray activation analysis (CNPGAA) is a nondestructive, multielement technique which has found application in the measurement of trace amounts of hydrogen. The sample is irradiated by a beam of “cold” neutrons; the presence of hydrogen is confirmed by the detection of a 2223 keV gamma-ray. The technique gives bulk analyses (the neutron and gamma radiation penetrate the sample), the hydrogen peak is free of interferences, and the results are independent of the chemical form of hydrogen present. The instrument is capable of detecting less than 10 mg/kg of hydrogen in many matrices. We have used the technique to measure hydrogen levels in a dielectric film on a silicon wafer, semiconductor grade germanium, and quartz.

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