scholarly journals Some Reflections on How Much Information is there on a Piece of Film, on How Film Compares with CCD Cameras and what Features a Scanner would need to Digitize TEM Negatives

1996 ◽  
Vol 4 (1) ◽  
pp. 24-27
Author(s):  
Alwyn Eades
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
The Other ◽  
Ccd Cameras ◽  
Know How ◽  
Transmission Electron ◽  
The World ◽  
Digital Methods

The world of electron microscopy is in a period of transition from acquiring images on film to acquiring images digitally, using CCD cameras, for example. It would be useful to know how much information there is on a piece of film, in order to know how film compares with digital methods and to be able to make good judgements on the optimum moment to change from one technology to the other.This is an attempt to use simple arguments to estimate just how much information there is in an image exposed on film in the transmission electron microscope. The main reason for addressing this issue is that, while many people are affected by it, there seems to be little agreement on the answer.

scholarly journals Some Reflections On How Much Information la There On A Piece Of Film, On How Film Compares With CCD Cameras And What Features A Scanner Would Meed To Digitize TEM Negatives

1998 ◽  
Vol 6 (9) ◽  
pp. 18-21
Author(s):  
Alwyn Eades
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
The Other ◽  
Ccd Cameras ◽  
Know How ◽  
Transmission Electron ◽  
The World ◽  
Digital Methods

The world of electron microscopy is in a period of transition from acquiring images on film to acquiring images digitally, using CCD cameras, for example. It would be useful to knew how much information there is on a piece of film, in order to know how film compares with digital methods and to be able to make good judgements on the optimum moment to change from one technology to the other.This is an attempt to use simple arguments to estimate just how much information there is in an image exposed on film in the transmission electron microscope, the main reason for addressing this issue Is that, while many people are affected by it there seems to be little agreement on the answer.

Development of 200 kV Scanning-Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 410-411
Author(s):  
H. Koike ◽  
S. Sakurai ◽  
K. Ueno ◽  
M. Watanabe
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
The Other ◽  
Morphological Observation ◽  
Magnetic Domains ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Backscattered Electron ◽  
Increasing Demand

In recent years, there has been increasing demand for higher voltage SEMs, in the field of surface observation, especially that of magnetic domains, dislocations, and electron channeling patterns by backscattered electron microscopy. On the other hand, the resolution of the CTEM has now reached 1 ∼ 2Å, and several reports have recently been made on the observation of atom images, indicating that the ultimate goal of morphological observation has beem nearly achieved.

Reconstruction of electron holograms recorded in a non-FEG, non-biprism TEM

1995 ◽  
Vol 53 ◽  
pp. 618-619
Author(s):  
Z.L. Wang
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Experimental Technique ◽  
Transmission Electron Microscope ◽  
The Other ◽  
Electron Holography ◽  
Transmission Electron ◽  
Coherent Sources ◽  
Imaging Theory ◽  
Normal Specimen

An experimental technique for performing electron holography using a non-FEG, non-biprism transmission electron microscope (TEM) has been introduced by Ru et al. A double stacked specimens, one being a single crystal foil and the other the specimen, are loaded in the normal specimen position in TEM. The single crystal, which is placed onto the specimen, is responsible to produce two beams that are equivalent to two virtual coherent sources illuminating the specimen beneath, thus, permitting electron holography of the specimen. In this paper, the imaging theory of this technique is described. Procedures are introduced for digitally reconstructing the holograms.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

scholarly journals A Novel Microchip Technique for Quickly Identifying Nanogranules in an Aqueous Solution by Transmission Electron Microscopy: Imaging of Platelet Granules

2020 ◽  
Vol 10 (14) ◽  
pp. 4946
Author(s):  
Nguyen Thi Thu Trang ◽  
Jungshan Chang ◽  
Wei-An Chen ◽  
Chih-Chun Chen ◽  
Hui-Min Chen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Aqueous Solution ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Human Platelet ◽  
Blood Collection ◽  
Ultrastructural Observation ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
Aqueous Conditions

Ultrastructural observation of biological specimens or nanogranules usually requires the use of electron microscopy. Electron microscopy takes a lot of time, requires many steps, and uses many chemicals, which may affect the native state of biological specimens. A novel microchip (K-kit) was used as a specimen kit for in situ imaging of human platelet granules in an aqueous solution using a transmission electron microscope. This microchip enabled us to observe the native human platelet granules very quickly and easily. The protocols included blood collection, platelet purification, platelet granule isolation, sample loading into this microchip, and then observation by a transmission electron microscope. In addition, these granules could still remain in aqueous solution, and only a very small amount of the sample was required for observation and analysis. We used this microchip to identify the native platelet granules by negative staining. Furthermore, we used this microchip to perform immunoelectron microscopy and successfully label α-granules of platelets with the anti-P-selectin antibody. These results demonstrate that the novel microchip can provide researchers with faster and better choices when using a transmission electron microscope to examine nanogranules of biological specimens in aqueous conditions.

Transmission Electron Microscope Study of Interfacial Reactions in Gold-Germanium Contact to Gallium Arsenide

1985 ◽  
Vol 54 ◽  
Author(s):  
Taeil Kim ◽  
D.D.L. Chung
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Microscope Study ◽  
Lattice Match ◽  
Perfect Lattice ◽  
Transmission Electron ◽  
Transmission Electron Microscope Study

ABSTRACTThe structure of 500 Å Au/500 A Ge/500 Å Au/GaAs (100) was studied by transmission electron microscopy after annealing at 350 – 500°C. Annealing at 350 – 450°C caused the formation of AuGeAs with a (110) texture, but this phase disappeared after annealing at 500°C. The hexagonal a-AuGa (or AuGa) was formed after annealing at 400°C, such that (111)Au // (0001)a, and [110]AU // [1120]a and there was perfect lattice match between Au (i.e., Au-rich solid solution) and a-AuGa. After annealing at 450°C or above, a phase tentatively identified as the hexagonal Au3Ga was formed and Ge (i.e., Ge-rich solid solution) became epitaxial to (100) GaAs. Annealing at 400°C caused Au to change from no texture to a (110) texture.

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