SHaRE: Collaborative materials science research

1988 ◽  
Vol 46 ◽  
pp. 804-805
Author(s):  
Edward A. Kenik ◽  
Karren L. More
Keyword(s):  
Electron Microscope ◽  
Materials Science ◽  
Analytical Electron Microscopy ◽  
Science Research ◽  
Atom Probe ◽  
Probe Field ◽  
Transmission Electron ◽  
Wide Range ◽  
Analytical Electron ◽  
Electron Microscopes

The Shared Research Equipment (SHaRE) Program provides access to the wide range of advanced equipment and techniques available in the Metals and Ceramics Division of ORNL to researchers from universities, industry, and other national laboratories. All SHaRE projects are collaborative in nature and address materials science problems in areas of mutual interest to the internal and external collaborators. While all facilities in the Metals and Ceramics Division are available under SHaRE, there is a strong emphasis on analytical electron microscopy (AEM), based on state-of-the-art facilities, techniques, and recognized expertise in the Division. The microscopy facilities include four analytical electron microscopes (one 300 kV, one 200 kV, and two 120 kV instruments), a conventional transmission electron microscope with a low field polepiece for examination of ferromagnetic materials, a high voltage (1 MV) electron microscope with a number of in situ capabilities, and a variety of EM support facilities. An atom probe field-ion microscope provides microstructural and elemental characterization at atomic resolution.

Instrumentation and Computation

1990 ◽  
Vol 48 (1) ◽  
pp. 2-3
Author(s):  
P.B. Hirsch
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Materials Science ◽  
Image Interpretation ◽  
Specimen Preparation ◽  
Scanning Tunnelling Microscope ◽  
Transmission Electron ◽  
Wide Range ◽  
Electron Microscopes ◽  
Types Of Information

The benefit to society arising from developments in instrumentation and computation can be judged primarily by the advances in knowledge and understanding generated by their application in different branches of science, covered in the other papers in this symposium. Without advances in instrumentation none of these advances is possible; developments in instrumentation and in image interpretation are therefore fundamental to and precede scientific advances in fields in which knowledge of structure is important. There is little doubt that the revolutionary first step was the development of the transmission electron microscope (TEM) in 1931 by Ernst Ruska; a second was the development of the scanning electron microscope (SEM); and the third the introduction of the scanning tunnelling microscope (STM) for high resolution surface imaging, by Binnig and Rohrer.The TEM and SEM have undergone continuous developments over the last 50 years or so, and have had a far-reaching impact in a wide range of disciplines; the STM is a relative newcomer but no doubt it too will have an increasing impact in furthering our understanding of solids and surfaces in particular. Once the basic instruments became available subsequent developments have been driven by the demands of the scientific disciplines in which these instruments have been applied. Many of the new developments in instrumentation and interpretation have been pioneered by the users themselves, and these in turn have led to modifications in commercial instruments to make such advances in technique available to the user community as a whole. Other developments have been initiated directly by the manufacturers as a result of a perceived need. There has been and continues to be a close interaction between the developers of hardware (not only of electron microscopes but also of ancillary equipment, e.g. microanalysis attachments, image processing equipment, specialist specimen stages, and specimen preparation facilities) and the users, leading to extensions in the range of applications and the types of information which can be obtained by electron microscopy. The following examples from the developments of electron microscopy in Materials Science illustrate these interactions and the particular advances arising from specific developments:

scholarly journals Materials science applications of a 120kV FEG TEM/STEM: Triskaidekaphilia

1991 ◽  
Vol 49 ◽  
pp. 698-699
Author(s):  
J. Bentley ◽  
A. T. Fisher ◽  
E. A. Kenik ◽  
Z. L. Wang
Keyword(s):  
Electron Microscope ◽  
Materials Science ◽  
X Ray ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Scanning Transmission ◽  
Potential Impact ◽  
Electron Microscopes ◽  
Electron Energy Loss

The introduction by several manufacturers of 200kV transmission electron microscopes (TEM) equipped with field emission guns affords the opportunity to assess their potential impact on materials science by examining applications of similar 100-120kV instruments that have been in use for more than a decade. This summary is based on results from a Philips EM400T/FEG configured as an analytical electron microscope (AEM) with a 6585 scanning transmission (STEM) unit, ED AX 9100/70 or 9900 energy dispersive X-ray spectroscopy (EDS) systems, and Gatan 607 serial- or 666 parallel-detection electron energy-loss spectrometers (EELS). Examples in four areas that illustrate applications that are impossible or so difficult as to be impracticable with conventional thermionic electron guns are described below.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

Analysis of Interesting Materials in the Environmental SEM: You Put What in Your Microscope?

2001 ◽  
Vol 7 (S2) ◽  
pp. 776-777
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscope ◽  
Chemical Engineering ◽  
Materials Science ◽  
Variable Pressure ◽  
Environmental Scanning ◽  
Specimen Preparation ◽  
Wide Range ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

The environmental scanning electron microscope (ESEM™) and variable pressure electron microscope (VPSEM) have become accepted tools in the contemporary electron microscopy facility. Their flexibility and their ability to image almost any sample with little, and often no, specimen preparation has proved so attractive that each manufacturer of scanning electron microscopes now markets a low vacuum model.The University of Michigan Electron Microbeam Analysis Laboratory (EMAL) operates two variable pressure instruments, an ElectroScan E3 ESEM and a Hitachi S3200N VPSEM. The E3 ESEM was acquired in the early 1990s with funding from the Amoco Foundation and it has been used to examine an extremely wide variety of different materials. Since EMAL serves the entire university community, and offers support to neighboring institutions and local industry, the types of materials examined span a wide range. There are users from Materials Science & Engineering, Chemical Engineering, Nuclear Engineering, Electrical Engineering, Physics, Chemistry, Geology, Biology, Biophysics, Pharmacy and Pharmacology.

Atom Probe Microscopy and its Future

1994 ◽  
Vol 332 ◽  
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
D. J. Larson ◽  
L. M. Holzman
Keyword(s):  
Materials Science ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Level ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Probe Field ◽  
Transmission Electron ◽  
Indispensable Tool ◽  
3D Information

ABSTRACTMuch of the current activity and excitement in materials science involves processing and understanding materials at the atomic scale. Accordingly, it is necessary for materials scientists to control and characterize materials at the atomic level. There are only a few microscopies that are capable of providing information about the structure of materials at the atomic level: the atom probe field ion microscope, the high resolution transmission electron microscope, and the scanning tunneling microscope. The three-dimensional atom probe (3DAP) determines the 3D location and elemental identity of each atom in a sample. It is the only technique that provides 3D information at the atomic scale.The origin and underlying concepts behind the 3DAP are described. Several examples of actual images from existing 3DAPs are shown with emphasis on nanometer-scale analysis. Current limitations of the technique and expected future developments in this form of microscopy are described. It is our opinion that 3D atomic-scale imaging will be an indispensable tool in materials science in the coming decades.

The Application of Atom-Probe Techniques in Materials Science and Technology

1981 ◽  
Vol 39 ◽  
pp. 12-15
Author(s):  
Brian Ralph ◽  
A.R. Waugh ◽  
S.A. Hill ◽  
M.J. Southon ◽  
M.P. Thomas
Keyword(s):  
Electron Microscopy ◽  
Materials Science ◽  
Atom Probe ◽  
Original Form ◽  
Surface Process ◽  
Fine Scale ◽  
Probe Field ◽  
Transmission Electron ◽  
Field Ion Microscope ◽  
Imaging Atom Probe

This brief review attempts to summarize the main uses to which the atom-probe field-ion microscope and its variants have been put in the examination of materials. No attempt is made to produce a comprehensive list of all the studies made to date, rather the type of application is illustrated from recent studies.The original form of the field-ion microscope was really limited to the acquisition of geometrical and crystallographic information on the fine scale distribution of defects and phases (e.g. 1). Even in these early applications, the study proved considerably more fruitful when other microstructural techniques, such as transmission electron microscopy, were applied in parallel. The advent of the atom-probe (AP) and imaging atom-probe (IAP) instruments allowed precise microchemical information to be obtained and these instruments have now been used for a number of detailed investigations of materials. In the main, these have divided into (I) studies of surface process and films (e.g. 2) and (II) investigations of phase distributions and segregation in the bulk (e.g. 3).

Energy-dispersive x-ray detectors for analytical electron microscopy

1991 ◽  
Vol 49 ◽  
pp. 986-987
Author(s):  
L. E. Thomas
Keyword(s):  
Collection Efficiency ◽  
Analytical Electron Microscopy ◽  
Energy Dispersive ◽  
Detector Performance ◽  
X Ray ◽  
Performance Improvements ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Scanning Transmission ◽  
Electron Microscopes

Continuing evolution of energy-dispersive x-ray spectrometer (EDS) systems has greatly advanced x-ray detector performance in analytical electron microscopes. The latest detectors offer improved energy resolution, count rate performance, geometrical collection efficiency, durability, and efficiency for light and heavy elements. Innovative detector designs for transmission and scanning transmission electron microscopes (TEM/STEMs) include such features as liquid-nitrogen-free operation, in situ de-icing of the detector crystal, user cleanable windows, demountable windows, ultrahigh vacuum compatibility (including adaptations to allow microscope bakeouts without removing the detector), beam damage protection, and microscope interfaces with optimized collection geometries. Divergent design philosophies have produced a variety of systems with specialized features, and users may face hard choices in selecting the best detector for the job. The aim of this paper is to review the current state of EDS detector development and the importance of the performance improvements to TEM/STEM users.

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