Remarks on the scattering of electrons by atomic fields

1930 ◽  
Vol 26 (4) ◽  
pp. 556-563 ◽  
Author(s):  
E. C. Bullard ◽  
H. S. W. Massey
Keyword(s):  
Angular Distribution ◽  
Atomic Number ◽  
Cross Sections ◽  
Approximate Expression ◽  
Thomas Fermi ◽  
Scattering Cross ◽  
Single Curve ◽  
Scattering Cross Sections

It is shown that, by use of the Thomas-Fermi atom, effective scattering cross-sections may be obtained from a single curve for all atoms (provided that the atomic number is not too small). This curve is calculated. The range of validity of such values has been obtained and Born's formula shown to be inaccurate for representing the scattering of electrons with velocities less than 400 volts except by atoms of very low atomic number. For the case of high velocities an approximate expression is obtained for the angular distribution allowing for screening by the extra-nuclear electrons.

Absolute inner-shell cross section determination for EELS analysis

1988 ◽  
Vol 46 ◽  
pp. 534-535
Author(s):  
P.A. Crozier
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Absolute Cross Section ◽  
Specimen Thickness ◽  
Mass Thickness ◽  
Scattering Cross ◽  
Before And After ◽  
Estimated Error ◽  
Scattering Cross Sections ◽  
Electron Microscopist

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.

scholarly journals Towards fully nonperturbative computations of inelastic ℓN scattering cross sections from lattice QCD

2020 ◽  
Vol 102 (11) ◽  
Author(s):  
Hidenori Fukaya ◽  
Shoji Hashimoto ◽  
Takashi Kaneko ◽  
Hiroshi Ohki
Keyword(s):  
Lattice Qcd ◽  
Cross Sections ◽  
Scattering Cross ◽  
Scattering Cross Sections

scholarly journals Combining ADF-EDX scattering cross-sections for elemental quantification of nanostructures

2021 ◽  
Vol 27 (S1) ◽  
pp. 600-602
Author(s):  
Zezhong Zhang ◽  
Annick De Backer ◽  
Ivan Lobato ◽  
Sandra Van Aert ◽  
Peter Nellist
Keyword(s):  
Cross Sections ◽  
Scattering Cross ◽  
Scattering Cross Sections

Total electron scattering cross-sections for carbon monoxide at low electron energies

Pramana ◽  
1998 ◽  
Vol 51 (3-4) ◽  
pp. 453-461 ◽  
Author(s):  
P. Rawat ◽  
K. P. Subramanian ◽  
Vijay Kumar
Keyword(s):  
Carbon Monoxide ◽  
Electron Scattering ◽  
Cross Sections ◽  
Total Electron ◽  
Scattering Cross ◽  
Scattering Cross Sections
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