An Atypical Medieval Burial at the Monte Dei Cappuccini Monastery in Torino (Italy): A Case Study With High-Precision Radiocarbon Dating

Radiocarbon ◽  
2020 ◽  
Vol 62 (2) ◽  
pp. 485-495
Author(s):  
Sara Rubinetti ◽  
Irka Hajdas ◽  
Carla Taricco ◽  
Silvia Alessio ◽  
Luca P G Isella ◽  
...  
Keyword(s):  
High Precision ◽  
Radiocarbon Dating ◽  
Time Interval ◽  
Historical Evidence ◽  
Medieval Period ◽  
Religious Nature

ABSTRACTIn 1989 an ancient burial consisting of a skeleton and a few objects was discovered at the Monte dei Cappuccini Monastery, in Torino (Italy). Anthropological analysis of the skeleton revealed that it belonged to a young man, and the archaeometric characterization of the objects suggested that most of them are compatible with the Medieval period. As a proper archeological survey was not conducted at the time of the finding, due to the religious nature of the site, a high-precision radiocarbon (14C) dating has been performed. The samples were processed with three different methods: besides the ultrafiltration (UF) treatment, we applied the “collagen” (COL) and the Longin-base (LB) methods. While UF and COL treatments provided compatible results, LB method returned ages older with respect the UF one, with significant disagreements in some cases and this evidence is supported by several measurements on the same individual. Thanks to the reduction of the uncertainty with the high number of measured samples and the availability of historical evidence, the possible age of the burial has been limited to the time interval 1464–1515 cal AD.

scholarly journals Sensor for the Characterization of 2D Angular Actuators with Picoradian Resolution and Nanoradian Accuracy with Microradian Range

Sensors ◽  
2020 ◽  
Vol 20 (24) ◽  
pp. 7034
Author(s):  
Marco Pisani ◽  
Milena Astrua ◽  
Srijith Bangaru Thirumalai Raj
Keyword(s):  
High Precision ◽  
Deflection Angle ◽  
Measurement Range ◽  
Practical Realization ◽  
Measurement Instruments ◽  
Actual Performance ◽  
Working Principle ◽  
The Deflection Angle

High precision angular actuators are used for high demanding applications such as laser steering for photolithography. Piezo technology allows developing actuators with a resolution as low as a few nanoradians, with bandwidths as high as several kilohertz. In most demanding applications, the actual performance of these instruments needs to be characterized. The best angular measurement instruments available today do not sufficient resolution and/or bandwidth to satisfy these needs. At the Istituto Nazionale di Ricerca Metrologica, INRIM a device was designed and built aiming at characterizing precision 2D angular actuators with a resolution surpassing the best devices on the market. The device is based on a multi reflection scheme that allows multiplying the deflection angle by a factor of 70. The ultimate resolution of the device is 2 prad/√Hz over a measurement range of 36 µrad with a measurement band >10 kHz. The present work describes the working principle, the practical realization, and a case study on a top-level commercial angular actuator (Nano-MTA2 produced by Mad City Labs).

scholarly journals Sensor for the Characterization of 2D Angular Actuators with Picoradian Resolution and Nanoradian Accuracy on the Microradian Range

2020 ◽  
Author(s):  
Marco Pisani ◽  
Milena Astrua ◽  
Srijith Thirumalai
Keyword(s):  
High Resolution ◽  
High Precision ◽  
Deflection Angle ◽  
Measurement Range ◽  
Practical Realization ◽  
Working Principle ◽  
The Deflection Angle

High precision angular actuators are used for high demanding applications such as laser steering for photolithography. Piezo technology allows developing actuators with such a high resolution that the characterization of the same is out of the capabilities of commercially available instruments. At INRIM we have designed and built a device to the purpose of characterizing precision 2D angular actuators with a resolution surpassing the best devices on the market. The device is based on a multi reflection scheme that allows multiplying the deflection angle by a factor of 70. The ultimate resolution of the device is 2 prad/√Hz over a measurement range of 36 µrad with a measurement band > 10 kHz. The working principle, the practical realization and the case study on a top-level commercial angular actuator (Nano-MTA2 produced by MadCityLabs) are described.

Construction of plastic contact deformation maps on ceramics: a case study on aluminum nitride

1996 ◽  
Vol 54 ◽  
pp. 636-637
Author(s):  
D. L. Callahan
Keyword(s):  
Plastic Deformation ◽  
Aluminum Nitride ◽  
Mechanical Response ◽  
Three Dimensional ◽  
Bright Field Image ◽  
Perfectly Plastic ◽  
Contrast Analysis ◽  
Deformation Patterns

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.

Integrating The Geophysical Characterization Of Seismic Thin Beds With Stochastic Reservoir Modeling: A Case Study From The Kutei Basin (Offshore Kalimantan, Indonesia)

2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  
Keyword(s):  
Reservoir Modeling ◽  
Geophysical Characterization

Failure Analysis of CDM-ESD Damage in a GaAs RFIC

2000 ◽  
Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Integrated Circuit ◽  
Production Test ◽  
Analysis Techniques ◽  
Device Model ◽  
Charged Device ◽  
Subsequent Failure

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.

dC/dV and CV Characterization of Gate Resistance Defects in eDRAM Circuits

2013 ◽  
Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney
Keyword(s):  
Deep Submicron ◽  
Work Flow ◽  
Localization Technique ◽  
Characterization Techniques ◽  
Capacitance Voltage ◽  
Gate Resistance

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.

Case Study and Fault Modeling for Wrong Redundancy Evaluation on DRAM Devices

2007 ◽  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel
Keyword(s):  
Failure Mode ◽  
Failure Modes ◽  
Fault Modeling ◽  
Mode Analysis ◽  
Root Cause ◽  
Failure Mode Analysis

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.

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