scholarly journals MATHIAS FORCING AND COMBINATORIAL COVERING PROPERTIES OF FILTERS

2015 ◽  
Vol 80 (4) ◽  
pp. 1398-1410 ◽  
Author(s):  
DAVID CHODOUNSKÝ ◽  
DUŠAN REPOVŠ ◽  
LYUBOMYR ZDOMSKYY
Keyword(s):  
Ground Model ◽  
Mathias Forcing ◽  
Covering Properties ◽  
Image Position

AbstractWe give topological characterizations of filters${\cal F}$onωsuch that the Mathias forcing${M_{\cal F}}$adds no dominating reals or preserves ground model unbounded families. This allows us to answer some questions of Brendle, Guzmán, Hrušák, Martínez, Minami, and Tsaban.

scholarly journals COMPUTABLE STRUCTURES IN GENERIC EXTENSIONS

2016 ◽  
Vol 81 (3) ◽  
pp. 814-832 ◽  
Author(s):  
JULIA KNIGHT ◽  
ANTONIO MONTALBÁN ◽  
NOAH SCHWEBER
Keyword(s):  
Positive Result ◽  
Generic Extension ◽  
Ground Model ◽  
Rigid Structure ◽  
Basic Properties ◽  
Image Position ◽  
Scott Rank ◽  
The Universe ◽  
Generic Extensions ◽  
Countable Structure

AbstractIn this paper, we investigate connections between structures present in every generic extension of the universe V and computability theory. We introduce the notion of generic Muchnik reducibility that can be used to compare the complexity of uncountable structures; we establish basic properties of this reducibility, and study it in the context of generic presentability, the existence of a copy of the structure in every extension by a given forcing. We show that every forcing notion making ω2 countable generically presents some countable structure with no copy in the ground model; and that every structure generically presentable by a forcing notion that does not make ω2 countable has a copy in the ground model. We also show that any countable structure ${\cal A}$ that is generically presentable by a forcing notion not collapsing ω1 has a countable copy in V, as does any structure ${\cal B}$ generically Muchnik reducible to a structure ${\cal A}$ of cardinality ℵ1. The former positive result yields a new proof of Harrington’s result that counterexamples to Vaught’s conjecture have models of power ℵ1 with Scott rank arbitrarily high below ω2. Finally, we show that a rigid structure with copies in all generic extensions by a given forcing has a copy already in the ground model.

scholarly journals ON SINGULAR STATIONARITY II (TIGHT STATIONARITY AND EXTENDERS-BASED METHODS)

2019 ◽  
Vol 84 (1) ◽  
pp. 320-342
Author(s):  
OMER BEN-NERIA
Keyword(s):  
Generic Extension ◽  
Ground Model ◽  
Regular Cardinals ◽  
Consistency Results ◽  
Image Position ◽  
Model Sequence

AbstractWe study the notion of tightly stationary sets which was introduced by Foreman and Magidor in [8]. We obtain two consistency results showing that certain sequences of regular cardinals ${\langle {\kappa _n}\rangle _{n < \omega }}$ can have the property that in some generic extension, every ground-model sequence of fixed-cofinality stationary sets ${S_n} \subseteq {\kappa _n}$ is tightly stationary. The results are obtained using variations of the short-extenders forcing method.

The consistency of the axiom of universality for the ordering of cardinalities

1985 ◽  
Vol 50 (2) ◽  
pp. 502-509
Author(s):  
Marco Forti ◽  
Furio Honsell
Keyword(s):  
Set Theory ◽  
Partially Ordered Set ◽  
Regular Cardinal ◽  
Ordered Set ◽  
Partial Ordering ◽  
Generic Extension ◽  
Ground Model ◽  
Partially Ordered ◽  
Transfer Method ◽  
Image Position

T. Jech [4] and M. Takahashi [7] proved that given any partial ordering R in a model of ZFC there is a symmetric submodel of a generic extension of where R is isomorphic to the injective ordering on a set of cardinals.The authors raised the question whether the injective ordering of cardinals can be universal, i.e. whether the following axiom of “cardinal universality” is consistent:CU. For any partially ordered set (X, ≼) there is a bijection f:X → Y such that(i.e. x ≼ y iff ∃g: f(x) → f(y) injective). (See [1].)The consistency of CU relative to ZF0 (Zermelo-Fraenkel set theory without foundation) is proved in [2], but the transfer method of Jech-Sochor-Pincus cannot be applied to obtain consistency with full ZF (including foundation), since CU apparently is not boundable.In this paper the authors define a model of ZF + CU as a symmetric submodel of a generic extension obtained by forcing “à la Easton” with a class of conditions which add κ generic subsets to any regular cardinal κ of a ground model satisfying ZF + V = L.

scholarly journals ITERATING SYMMETRIC EXTENSIONS

2019 ◽  
Vol 84 (1) ◽  
pp. 123-159 ◽  
Author(s):  
ASAF KARAGILA
Keyword(s):  
Axiom Of Choice ◽  
Generic Extension ◽  
Ground Model ◽  
Intermediate Model ◽  
Symmetric Extension ◽  
Consistency Results ◽  
New Models ◽  
Image Position ◽  
The Axiom Of Choice

AbstractThe notion of a symmetric extension extends the usual notion of forcing by identifying a particular class of names which forms an intermediate model of $ZF$ between the ground model and the generic extension, and often the axiom of choice fails in these models. Symmetric extensions are generally used to prove choiceless consistency results. We develop a framework for iterating symmetric extensions in order to construct new models of $ZF$. We show how to obtain some well-known and lesser-known results using this framework. Specifically, we discuss Kinna–Wagner principles and obtain some results related to their failure.

Simple Identification of Electron Diffraction Ring Patterns

1969 ◽  
Vol 27 ◽  
pp. 160-161
Author(s):  
Carolyn Nohr ◽  
Ann Ayres
Keyword(s):  
Electron Microscope ◽  
Electron Diffraction ◽  
Diffraction Ring ◽  
Image Position

Texts on electron diffraction recommend that the camera constant of the electron microscope be determine d by calibration with a standard crystalline specimen, using the equation

Atomic orientation effects in proton stopping at low velocity

1983 ◽  
Vol 41 ◽  
pp. 708-709
Author(s):  
Kin Lam
Keyword(s):  
Polycrystalline Material ◽  
Charged Particles ◽  
Target Material ◽  
Stopping Power ◽  
Low Velocity ◽  
Electronic Density ◽  
Interatomic Distances ◽  
Frame Work ◽  
Image Position ◽  
Atomic Orientation

The energy of moving ions in solid is dependent on the electronic density as well as the atomic structural properties of the target material. These factors contribute to the observable effects in polycrystalline material using the scanning ion microscope. Here we outline a method to investigate the dependence of low velocity proton stopping on interatomic distances and orientations.The interaction of charged particles with atoms in the frame work of the Fermi gas model was proposed by Lindhard. For a system of atoms, the electronic Lindhard stopping power can be generalized to the formwhere the stopping power function is defined as

A Magnetic Spectrometer for a Scanning Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 436-437
Author(s):  
A. Kosiara ◽  
J. W. Wiggins ◽  
M. Beer
Keyword(s):  
Scanning Transmission Electron Microscope ◽  
Magnetic Spectrometer ◽  
Fringe Field ◽  
Curvature Radius ◽  
Magnetic Pole ◽  
Quadrupole Field ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Under Construction ◽  
Image Position

A magnetic spectrometer to be attached to the Johns Hopkins S. T. E. M. is under construction. Its main purpose will be to investigate electron interactions with biological molecules in the energy range of 40 KeV to 100 KeV. The spectrometer is of the type described by Kerwin and by Crewe Its magnetic pole boundary is given by the equationwhere R is the electron curvature radius. In our case, R = 15 cm. The electron beam will be deflected by an angle of 90°. The distance between the electron source and the pole boundary will be 30 cm. A linear fringe field will be generated by a quadrupole field arrangement. This is accomplished by a grounded mirror plate and a 45° taper of the magnetic pole.

Optimizing conditions for x-ray microchemical analysis in analytical electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 548-549 ◽  
Author(s):  
N. J. Zaluzec
Keyword(s):  
Solid Angle ◽  
Analytical Electron Microscopy ◽  
Incident Beam ◽  
Thin Foil ◽  
Experimental Conditions ◽  
X Ray ◽  
Microchemical Analysis ◽  
Analytical Electron ◽  
Image Position ◽  
Incident Beam Energy

The ultimate sensitivity of microchemical analysis using x-ray emission rests in selecting those experimental conditions which will maximize the measured peak-to-background (P/B) ratio. This paper presents the results of calculations aimed at determining the influence of incident beam energy, detector/specimen geometry and specimen composition on the P/B ratio for ideally thin samples (i.e., the effects of scattering and absorption are considered negligible). As such it is assumed that the complications resulting from system peaks, bremsstrahlung fluorescence, electron tails and specimen contamination have been eliminated and that one needs only to consider the physics of the generation/emission process.The number of characteristic x-ray photons (Ip) emitted from a thin foil of thickness dt into the solid angle dΩ is given by the well-known equation

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

SEM analysis of the change in the reaction rates with deposit structures in the copper-iron cementation system

1978 ◽  
Vol 36 (1) ◽  
pp. 456-457
Author(s):  
V. Annamalai ◽  
L.E. Murr
Keyword(s):  
Structural Characteristics ◽  
Secondary Electron Emission ◽  
Copper Deposit ◽  
Reaction Rates ◽  
Sem Analysis ◽  
Experimental Conditions ◽  
Major Drawback ◽  
Emission Mode ◽  
Scrap Iron ◽  
Image Position

Economical recovery of copper metal from leach liquors has been carried out by the simple process of cementing copper onto a suitable substrate metal, such as scrap-iron, since the 16th century. The process has, however, a major drawback of consuming more iron than stoichiometrically needed by the reaction.Therefore, many research groups started looking into the process more closely. Though it is accepted that the structural characteristics of the resultant copper deposit cause changes in reaction rates for various experimental conditions, not many systems have been systematically investigated. This paper examines the deposit structures and the kinetic data, and explains the correlations between them.A simple cementation cell along with rotating discs of pure iron (99.9%) were employed in this study to obtain the kinetic results The resultant copper deposits were studied in a Hitachi Perkin-Elmer HHS-2R scanning electron microscope operated at 25kV in the secondary electron emission mode.

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