X-ray and Raman study of spray pyrolysed vanadium oxide thin films

2011 ◽  
Vol 57 (2) ◽  
pp. 182-186 ◽  
Author(s):  
A. Bouzidi ◽  
N. Benramdane ◽  
S. Bresson ◽  
C. Mathieu ◽  
R. Desfeux ◽  
...  
2013 ◽  
Vol 652-654 ◽  
pp. 1747-1750
Author(s):  
Shuang Chen ◽  
Li Fang Zhang ◽  
Cui Zhi Dong ◽  
Kuai Zhang ◽  
Xiudong Zhu

W-doped Vanadium oxide thin films were prepared on the substrates of glass and Si (100) by reactive magnetron sputtering after annealing in vacuum. The structure and morphology were characterized by X-ray diffractometer and atomic force microscopy(AFM), respectively. The results show that,when the oxygen volume percent (Po2) increasing from 15% to 25%, the films on the Si(100) were vanadium oxides with high-valences. After vacuum annealing at 500°C for 2h, the major phase of W doped films on glass is VO2. The surface roughness of the film increase for the longer time annealing.


2009 ◽  
Vol 94 (22) ◽  
pp. 222110 ◽  
Author(s):  
S. S. N. Bharadwaja ◽  
C. Venkatasubramanian ◽  
N. Fieldhouse ◽  
S. Ashok ◽  
M. W. Horn ◽  
...  

2021 ◽  
Vol 23 (14) ◽  
pp. 8439-8445
Author(s):  
Ying Wang ◽  
Piotr Igor Wemhoff ◽  
Mikołaj Lewandowski ◽  
Niklas Nilius

Electron injection from an STM tip has been used to desorb individual vanadyl groups from vanadium oxide thin films. The underlying mechanism is analyzed from the bias and current dependence of the desorption rate.


2010 ◽  
Vol 16 (S2) ◽  
pp. 1654-1655
Author(s):  
BD Gauntt ◽  
EC Dickey

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.


2018 ◽  
Vol 36 (1) ◽  
pp. 41-48 ◽  
Author(s):  
M. Seref Sonmez ◽  
Esma Yilmaz ◽  
Duygu Kalkan ◽  
Esra Ozkan Zayim

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