Electronic, topological phase and optical properties of XPdBi (X = Lu, Sc) nano-layers

2016 ◽  
Vol 616 ◽  
pp. 287-296 ◽  
Author(s):  
Mitra Narimani ◽  
Zahra Nourbakhsh
Keyword(s):  
Optical Properties ◽  
Topological Phase

Topological phase and optical properties of LuNiBi bulk and nano-layer

2017 ◽  
Vol 634 ◽  
pp. 112-120 ◽  
Author(s):  
Mitra Narimani ◽  
Zahra Nourbakhsh
Keyword(s):  
Optical Properties ◽  
Topological Phase

scholarly journals Electron-electron interactions, topological phase, and optical properties of a charged artificial benzene ring

2015 ◽  
Vol 92 (24) ◽  
Author(s):  
Isil Ozfidan ◽  
Milos Vladisavljevic ◽  
Marek Korkusinski ◽  
Pawel Hawrylak
Keyword(s):  
Optical Properties ◽  
Benzene Ring ◽  
Topological Phase ◽  
Electron Interactions

Design of objective lens for 200-kV high-resolution electron microscopes

1983 ◽  
Vol 41 ◽  
pp. 314-315
Author(s):  
K. Tsuno ◽  
T. Honda ◽  
Y. Harada ◽  
M. Naruse
Keyword(s):  
Optical Properties ◽  
Computer Technology ◽  
Axial Magnetic Field ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Resolution Electron ◽  
Correction Of Astigmatism ◽  
Three Stages ◽  
Electron Microscopes ◽  
Stage 1

Developement of computer technology provides much improvements on electron microscopy, such as simulation of images, reconstruction of images and automatic controll of microscopes (auto-focussing and auto-correction of astigmatism) and design of electron microscope lenses by using a finite element method (FEM). In this investigation, procedures for simulating the optical properties of objective lenses of HREM and the characteristics of the new lens for HREM at 200 kV are described.The process for designing the objective lens is divided into three stages. Stage 1 is the process for estimating the optical properties of the lens. Firstly, calculation by FEM is made for simulating the axial magnetic field distributions Bzc of the lens. Secondly, electron ray trajectory is numerically calculated by using Bzc. And lastly, using Bzc and ray trajectory, spherical and chromatic aberration coefficients Cs and Cc are numerically calculated. Above calculations are repeated by changing the shape of lens until! to find an optimum aberration coefficients.

Optical Properties of HVEM Accelerators

1975 ◽  
Vol 33 ◽  
pp. 180-181
Author(s):  
A. Strojnik ◽  
J.W. Scholl ◽  
V. Bevc
Keyword(s):  
Optical Properties ◽  
Electron Accelerator ◽  
Systematic Investigation ◽  
Electron Source ◽  
High Brightness ◽  
The Past ◽  
Wide Range ◽  
Optical Behavior

The electron accelerator, as inserted between the electron source (injector) and the imaging column of the HVEM, is usually a strong lens and should be optimized in order to ensure high brightness over a wide range of accelerating voltages and illuminating conditions. This is especially true in the case of the STEM where the brightness directly determines the highest resolution attainable. In the past, the optical behavior of accelerators was usually determined for a particular configuration. During the development of the accelerator for the Arizona 1 MEV STEM, systematic investigation was made of the major optical properties for a variety of electrode configurations, number of stages N, accelerating voltages, 1 and 10 MEV, and a range of injection voltages ϕ0 = 1, 3, 10, 30, 100, 300 kV).

Differential polarization imaging of sickled cells

1988 ◽  
Vol 46 ◽  
pp. 62-63
Author(s):  
Marcos F. Maestre
Keyword(s):  
Optical Properties ◽  
Theoretical Approach ◽  
Polarized Light ◽  
Polarization Microscopy ◽  
Spectroscopic Techniques ◽  
Polarization Imaging ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Microscopic Scale ◽  
Chiral Structures

Recently we have developed a form of polarization microscopy that forms images using optical properties that have previously been limited to macroscopic samples. This has given us a new window into the distribution of structure on a microscopic scale. We have coined the name differential polarization microscopy to identify the images obtained that are due to certain polarization dependent effects. Differential polarization microscopy has its origins in various spectroscopic techniques that have been used to study longer range structures in solution as well as solids. The differential scattering of circularly polarized light has been shown to be dependent on the long range chiral order, both theoretically and experimentally. The same theoretical approach was used to show that images due to differential scattering of circularly polarized light will give images dependent on chiral structures. With large helices (greater than the wavelength of light) the pitch and radius of the helix could be measured directly from these images.

A transmission electron microscopic study of structural transitions in fast ionic conductors

1987 ◽  
Vol 45 ◽  
pp. 156-157
Author(s):  
R. B. Queenan ◽  
P. K. Davies
Keyword(s):  
Optical Properties ◽  
Ionic Conduction ◽  
Recent Observation ◽  
Ionic Conductivities ◽  
Sodium Aluminate ◽  
Two Dimensions ◽  
Ionic Conductors ◽  
Electron Microscopic ◽  
Transmission Electron ◽  
Trivalent Cations

Na ß“-alumina (Na1.67Mg67Al10.33O17) is a non-stoichiometric sodium aluminate which exhibits fast ionic conduction of the Na+ ions in two dimensions. The Na+ ions can be exchanged with a variety of mono-, di-, and trivalent cations. The resulting exchanged materials also show high ionic conductivities.Considerable interest in the Na+-Nd3+-ß“-aluminas has been generated as a result of the recent observation of lasing in the pulsed and cw modes. A recent TEM investigation on a 100% exchanged Nd ß“-alumina sample found evidence for the intergrowth of two different structure types. Microdiffraction revealed an ordered phase coexisting with an apparently disordered phase, in which the cations are completely randomized in two dimensions. If an order-disorder transition is present then the cooling rates would be expected to affect the microstructures of these materials which may in turn affect the optical properties. The purpose of this work was to investigate the affect of thermal treatments upon the micro-structural and optical properties of these materials.

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